The Dynamics of Electromigration in Copper Nanocontacts
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概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2009-07-25
著者
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KIZUKA Tokushi
Institute of Materials Science, University of Tsukuba
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Kizuka Tokushi
Institute Of Materials Science University Of Tsukuba
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AOKI Hisanori
Institute of Materials Science, University of Tsukuba
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Aoki Hisanori
Institute Of Materials Science University Of Tsukuba
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Kizuka Tokushi
Institute Of Industrial Science The University Of Tokyo
関連論文
- Structural Analysis of C_ Nanotubes Heat-Treated in Vacuum
- Direct Observation of Electromigration and Induced Stress in Cu Nanowire
- Effect of Lateral Displacement of Atomic Force Microscope Tip Caused by Contact Scanning Studied by In Situ Transmission Electron Microscopy
- In Situ Transmission Electron Microscopy of Deformation of Crystalline C_ Nanotubes
- Electrical Conducting Properties of Amorphous Carbon Nanowhiskers Studied by In Situ High-Resolution Transmission Electron Microscopy
- Mechanical Properties of Nanometer-sized Fullerene C_ Whiskers Studied by In situ High-Resolution Transmission Electron Microscopy
- In situ High-Resolution Transmission Electron Microscopy of Deformation of Multi-walled Carbon Nanometer-sized capsules
- The Dynamics of Electromigration in Copper Nanocontacts
- Individual cathode luminescence spectroscopy of zinc oxide particles based on in situ transmission electron microscopy
- Structure, Conductance and Strength of Atomic-Sized Iridium Wires
- Structure, strength and conductance of palladium wires of single atom width
- Relationship between structure and conductance of nanometer-sized iridium contacts
- Structures of Nanocrystalline MgO, ZnO and WO_3 Prepared by Gas Evaporation and in situ Compaction
- Structures of Ag/Zno, Ag/WO_3 and Ag/Al-oxide Nanocrystalline Composites Prepared by Gas Evaporation and in-situ Compaction
- Effect of Lateral Displacement of Atomic Force Microscope Tip Caused by Contact Scanning Studied by In Situ Transmission Electron Microscopy
- Structure and Tensile Force of Nanometer- and Atomic-Sized Gold Contacts during Conductance Feedback Control
- In Situ High-Resolution Transmission Electron Microscopy of Elastic Deformation and Fracture of Nanometer-Sized Fullerene C60 Whiskers
- Palladium Wires of Single Atom Width as Mechanically Controlled Switching Devices
- Slip Sequences during Tensile Deformation of Palladium Nanocontacts
- Growth of Silicon Nanowires by Nanometer-Sized Tip Manipulation
- Bending Process and Young's Modulus of Fullerene C60 Nanowhiskers
- Direct Observation of Electromigration and Induced Stress in Cu Nanowire
- Structure, Electrical, and Mechanical Properties of Silver Nanocontacts
- Electric Conduction of Amorphous Carbon and Graphitic Nanocontacts