In Situ High-Resolution Transmission Electron Microscopy of Elastic Deformation and Fracture of Nanometer-Sized Fullerene C60 Whiskers
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概要
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We deformed crystalline whiskers composed of fullerene C60 molecules inside a high-resolution transmission electron microscope. The diameters of the whiskers ranged from 200 to 1000 nm and the length extended to the submillimeter scale. We selected one whisker with a body-centered tetragonal structure with a typical diameter, i.e., 540 nm, for analyses of deformation. It was found that the whisker arched elastically and the radius of curvature decreased to 20 μm until fracture, showing that the whisker's fracture strain was 0.013. Fracture occurred along {100} of the whisker, perpendicular to its longer growth axis.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-10-15
著者
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KATO Ryoei
Institute of Material Science, University of Tsukuba
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Asaka Koji
Special Research Project On Nanoscience Graduate School Of Pure And Applied Sciences University Of T
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Kizuka Tokushi
Institute Of Industrial Science The University Of Tokyo
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Asaka Koji
Special Research Project on Nanoscience, Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan
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Kato Ryoei
Institute of Materials Science, Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
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