Effect of Lateral Displacement of Atomic Force Microscope Tip Caused by Contact Scanning Studied by In Situ Transmission Electron Microscopy

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概要

• 論文の詳細を見る
• Japan Society of Applied Physicsの論文
• 2003-10-01

著者

• KIZUKA Tokushi

  Institute of Materials Science, University of Tsukuba

• Fujisawa Satoru

  National Institute Of Advanced Industrial Science And Technology(aist)

• Fujisawa Satoru

  National Institute Of Advanced.ln_du}trial Science And Technology

関連論文

• Structural Analysis of C_ Nanotubes Heat-Treated in Vacuum
• Direct Observation of Electromigration and Induced Stress in Cu Nanowire
• Effect of Lateral Displacement of Atomic Force Microscope Tip Caused by Contact Scanning Studied by In Situ Transmission Electron Microscopy
• In Situ Transmission Electron Microscopy of Deformation of Crystalline C_ Nanotubes
• Electrical Conducting Properties of Amorphous Carbon Nanowhiskers Studied by In Situ High-Resolution Transmission Electron Microscopy
• Mechanical Properties of Nanometer-sized Fullerene C_ Whiskers Studied by In situ High-Resolution Transmission Electron Microscopy
• In situ High-Resolution Transmission Electron Microscopy of Deformation of Multi-walled Carbon Nanometer-sized capsules
• The Dynamics of Electromigration in Copper Nanocontacts
• Effect of Lateral Displacement of Atomic Force Microscope Tip Caused by Contact Scanning Studied by In Situ Transmission Electron Microscopy
• Direct Observation of Electromigration and Induced Stress in Cu Nanowire

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