Length Adjustment of Carbon Nanotube Probe by Electron Bombardment
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概要
- 論文の詳細を見る
A method for the processing of an individual nanotube, which is based on the thermally assisted field evaporation process, has been performed using a nanomanipulator installed in a scanning electron microscope. One nanotube is placed opposite another at a distance of about one micrometer and voltage is applied between them. As the voltage is increased, one of the nanotubes is locally heated by electron bombardment at the tip and is shortened by thermally assisted field evaporation, where another nanotube is used as an electron emission source. A nanotube for an atomic force microscope probe has successfully been processed on a scale of 〜l00nm using the proposed method.
- 社団法人応用物理学会の論文
- 2002-07-30
著者
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秋田 成司
大阪府大工
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Nakayama Yoshikazu
Department Of Electrical Engineering College Of Engineering University Of Osaka
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Akita Seiji
College Of Engineering Graduate School Of Osaka Prefecture University
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Akita Seiji
Department Of Physics And Electronics Osaka Prefecture University
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Akita Seiji
Colleage Of Engineering University Of Osaka Prefecture
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Akita Seiji
Department Of Physics And Electronics University Of Osaka Prefecture
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Akita Seiji
Department Of Physics And Electronics College Of Engineering University Of Osaka Prefecture
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Akita Seiji
Department Of Physics And Electronicsg Graduate School Of Engineering Osaka Prefecture University
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Akita Seiji
Department Of Physics And Electronics Graduate School Of Engineering Osaka Prefecture University
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