Depletion-Discharge Transient Spectroscopy: Direct Determination of the Density of Deep Emission States in Amorphous Semiconductors : Electrical Properties of Condensed Matter
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1988-03-20
著者
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秋田 成司
大阪府大工
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Nakayama Yoshikazu
College Of Engineering University Of Osaka Prefecture
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Akita Seiji
College Of Engineering Graduate School Of Osaka Prefecture University
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Akita Seiji
Department Of Physics And Electronics Osaka Prefecture University
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Akita Seiji
Colleage Of Engineering University Of Osaka Prefecture
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Akita Seiji
Department Of Physics And Electronics University Of Osaka Prefecture
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Akita Seiji
Department Of Physics And Electronicsg Graduate School Of Engineering Osaka Prefecture University
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KAWAMURA Takao
Colleage of Engineering, University of Osaka Prefecture
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Kawamura Takao
Colleage Of Engineering University Of Osaka Prefecture
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Nakayama Yoshikazu
Colleage Of Engineering University Of Osaka Prefecture
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