Scanning Probe Microscope Tip with Carbon Nanotube Truss
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概要
- 論文の詳細を見る
We have fabricated a scanning probe microscope tip with a truss consisting of two nanotubes using a scanning electron microscope manipulator. The tip of the nanotube truss was successfully positioned on the optical axis of a tapered optical fiber used as the base. Force curve measurements for the nanotube truss were also performed using the manipulator to investigate the mechanical strength of the truss. The stiffness of the truss was 3.5 higher than that of the individual nanotube.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-07-15
著者
-
Nakayama Yoshikazu
Department Of Electrical Engineering College Of Engineering University Of Osaka
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Akita Seiji
Department Of Physics And Electronics College Of Engineering University Of Osaka Prefecture
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