Extraction of Inner Shell from Multiwall Carbon Nanotubes for Scanning Probe Microscope Tip
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概要
- 論文の詳細を見る
We demonstrate a novel method for providing a capped sharp probe for a scanning probe microscope based on the extraction of the inner shell of the multiwall nanotube using a combination of well-controlled electrical breakdown and manipulation processes inside the scanning electron microscope. The measured sliding force for the extraction of the inner shell is consistent with the theoretical prediction based on the van der Waals interaction between the inner and the outer shells of the nanotube. Hence, the proposed process realizes the ideal sliding of the interlayer of the nanotube.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-06-15
著者
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Nakayama Yoshikazu
Department Of Electrical Engineering College Of Engineering University Of Osaka
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Akita Seiji
Department Of Physics And Electronics College Of Engineering University Of Osaka Prefecture
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