Mechanical Properties of Sharpened Carbon Nanotube Tips
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概要
- 論文の詳細を見る
We investigate the mechanical properties of sharpened nanotube tips for use in scanning probe microscopy in terms of tip bending under a force acting on the side of the tip. The sharpened nanotube probe fabricated by means of a modified electrical breakdown process effectively acts as a probe with high lateral resolution not only in the topographic measurement but also in the potential distribution measurement. Based on molecular mechanics calculations for a sharpened triple-walled nanotube probe, although the interlayer van-der-Waals interaction weakens the probe stiffness expected on the basis of the continuum model, the stiffness of the tapered nanotube is confirmed to be 10 times higher than that for a single-walled nanotube with the same tip radius and the same length.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-04-15
著者
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Nakayama Yoshikazu
Department Of Electrical Engineering College Of Engineering University Of Osaka
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Ohashi Masakaki
Department Of Physics And Electronics Osaka Prefecture University
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Akita Seiji
Department Of Physics And Electronics College Of Engineering University Of Osaka Prefecture
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Nakayama Yoshikazu
Department of Physics and Electronics, Osaka Prefecture University, 1-1 Gakuen-cho, Sakai, Osaka 599-8531, Japan
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Ohashi Masakaki
Department of Physics and Electronics, Osaka Prefecture University, 1-1 Gakuen-cho, Sakai, Osaka 599-8531, Japan
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