Experimental Determination of Valence Band Discontinuities : Semiconductors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2001-05-01
著者
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CHICHIBU Shigefusa
Institute of Applied Physics, University of Tsukuba
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SUGIYAMA Mutsumi
Institute of Applied Physics and Graduate School of Pure and Applied Sciences, University of Tsukuba
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NAKANISHI Hisayuki
Department of Electrical Engineering, Faculty of Science and Technology, Science University of Tokyo
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Chichibu Shigefusa
Institute Of Applied Physics University Of Tsukuba:department Of Electrical Engineering Science Univ
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Chichibu Shigefusa
Institute Of Applied Physics And 21st Century Center-of-excellence Office University Of Tsukuba
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Nakanishi Hisayuki
Department Of Electrical Engineering Science University Of Tokyo
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Nakanishi Hisayuki
Department Of Electrical Engineering Faculty Of Science And Technology
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Sugiyama Mutsumi
Institute Of Applied Physics University Of Tsukuba
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