Observation of Dislocation Lines in a Transistor by Electron-Acoustic Microscopy : Acoustical Measurements and Instrumentation

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Strain Relaxation in InGaAs Epilayers on GaAs by Means of Twin Formation
Indistinct Defect Images in Topographs of Nearly Perfect Aluminum Crystals Just Prior to Appearance of Dislocation Loops : Condensed Matter: Structure, etc.
Synchrotron Radiation Topographic Camera for Continuous Observation
Investigation of Surface Damage in Si Exposed to Ar Plasma by Spectroscopic Ellipsometry and Grazing X-Ray Diffraction
Antiphase Domain Structure in Gd_Sc_ Single-Crystal Alloys
Nondestructive Internal Observation and Distribution of Potential with Bias Application of npn Si Darlington Transistor Chip Using Electron-Acoustic Microscopy
Freezing of Interstitial-Type Dislocation Loops Grown as Vacancy Sources in Nearly Perfect Aluminum Crystals
Application of High-Resolution Film for Lithography to Synchrotron X-Ray Topography
Improved High-Temperature X-Ray Lang Camera
New Vacancy Source in Ultrahigh-Purity Aluminum Single Crystals with a Low Dislocation Density (Condensed Matter : Structure, Mechanical and Thermal Properties)
Observation of Dislocation Lines in a Transistor by Electron-Acoustic Microscopy : Acoustical Measurements and Instrumentation
p-CuGa_In_xS_2/n-ZnSe Heterojunction by LPE Method from In Solution
LPE Growth of ZnSnAs_2 on a ZnSe Substrate from a Sn Solution
Electrical and Optical Properties of p・ZnSnAs_2/n・ZnSe Heterodiode
The Hall Measurement of Heat-Treated CuInSe_2
Preparation and some Properties of CuInSe_2 on ZnSe Heterojunction Grown by LPE : CHALCOPYRITES : THIN FILMS AND JUNCTIONS
Liquid Phase Epitaxial Growth of CuGaTe_2 on ZnSe from Bi Solution
Heteroepitaxy of CuInS_2 on ZnSe by LPE Method from In Solution
Studies on Ultrasonic Butt Welding Using 19 kHz Vibration Systems : High Power Ultrasonics
Effective Range of Observable Depth by Electron-Acoustic Microscopy Using Two-Phase Electron Acoustic Signals : Ultrasonic Measurement
Electron-Acoustic Microscopic Study on Dislocation Lines in the Base Region of npn Si-Tr : Ultrasonic Microscopy and Nondestructive Testing
Visualization of Hydride in Titanium and Titanium-Aluminide by Refraction-Enhanced X-ray Imaging Technique
Site of Ultrasonic Signal Generation from a Junction of a Transistor-Chip by Excitation of the Chopped Electron Beam
Site of Electron Acoustic Signal Generation from Junction of an npn Si Transistor-Chip under Bias Application : Physical Acoustics
Depth Directional Study by Electron-Acoustic Microscopy : Photoacoustic Spectroscopy and Ultrasonic Microscopy
Contrast of Electron-Acoustic Microscopic Image : For Si Tr-Chip under Bias Application : Ultrasonic Imaging and Microscopy
Nondestructive Profiling of Transistor-Chip under Bias Application by Electron-Acoustic Microscopy : Ultrasonic Imaging and Microscopy
Cathodoluminescence Study on Diffusion Coefficients of Al, Ga and In in ZnSe
Generation of Electron-Acoustic Signals and Distribution of Potential in Transistor Chip under Applied of Bias
The Range of Observable Depth in a pnp Si Darlington Tr-Chip by Electron-Acoustic Microscopy : Mechanical and Scoustical Properties
Imaging of a Diffused Region in a Si Tr-Chip by Electron-Acoustic Microscopy (EAM) : Ultrasonic Imaging and Microscopy
A Study of Silicon Transistor-Tip by Electron-Acoustic Microscopy
Grazing Incident X-Ray Topographs of Heteroepitaxial ZnSe Films on GaAs Substrates
Investigation of Surface Damage in Si Exposed to Ar Plasma by Spectroscopic Ellipsometry and Grazing X-Ray Diffraction
LPE Growth of CuGa_In_xS_2 on ZnSe Substrate Using a Mixture of CuGaS_2 and CuInS_2 as a Solute

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