Nondestructive Profiling of Transistor-Chip under Bias Application by Electron-Acoustic Microscopy : Ultrasonic Imaging and Microscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1991-08-31
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関連論文
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- The Hall Measurement of Heat-Treated CuInSe_2
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- Liquid Phase Epitaxial Growth of CuGaTe_2 on ZnSe from Bi Solution
- Heteroepitaxy of CuInS_2 on ZnSe by LPE Method from In Solution
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- Site of Ultrasonic Signal Generation from a Junction of a Transistor-Chip by Excitation of the Chopped Electron Beam
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- Depth Directional Study by Electron-Acoustic Microscopy : Photoacoustic Spectroscopy and Ultrasonic Microscopy
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- Imaging of a Diffused Region in a Si Tr-Chip by Electron-Acoustic Microscopy (EAM) : Ultrasonic Imaging and Microscopy
- A Study of Silicon Transistor-Tip by Electron-Acoustic Microscopy
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