Extreme Ultraviolet Spectra of Emission from Plasma Focus. : III. AIV to IX and SiVI to X Ion Lines from 60 to 350 Å
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概要
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Multiply-ionized Al- and Si-ions were produced in plasma focus discharges in He or Ar ambient gas using various electrodes. The extreme ultraviolet spectra of emissions from Al-and Si-ions were observed in the wavelength range from 60 to 500Å with a grazing incidence spectrograph. The observed lines were mainly 2s-electron excitation lines from AIV(2s^22p^5) to IX(2s^22p) (or SiVI to X) for discharges in Ar gas and 2p-electron excitation lines from AIV(2s^22p^5) to VII(2s^22p^3) (or SiVI to VIII) for discharges in He. The relative line-intensities were determined, and the Al- and Si-ion lines observed have been tabulated together with their relative intensities. The results show anomalous population distributions among the 2s-electron excitation levels in AlVII to IX (or SiVIII to X) ions for the discharges in Ar gas, and these anomalous distributions are discussed in this paper.
- 社団法人応用物理学会の論文
- 1982-01-05
著者
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Fukuda Kuniya
Department Of Engineering Physics Faculty Engineering Kyoto University
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Hasama Toshifumi
Department Of Engineering Physics Faculty Of Engineering Kyoto University
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