Raman Spectroscopy and Positron Lifetime Studies of Structural Relaxation and Defect Evolution in Amorphous Silicon
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-10-15
著者
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SUZUKI Ryoichi
Electrotechnical Laboratory
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Sato F
Jasco Corp. Tokyo Jpn
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SATO Fumio
NHK Science and Technical Research Laboratories
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HIROYAMA Yuichi
Department of Materials Science & Engineering, Kyushu University
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HIRANO Yoshiyuki
NHK Science & Technical Research Laboratories
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MOTOOKA Teruaki
Department of Materials Science & Engineering, Kyushu University
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Motooka T
Kyushu Univ. Fukuoka Jpn
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Hiroyama Yuichi
Department Of Materials Science & Engineering Kyushu University
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Motooka Teruaki
Department Of Materials Science & Engineering Kyushu University
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Hirano Yoshiyuki
Nhk Science & Technical Research Laboratories
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Sato Fumio
Nhk Science & Technical Research Laboratories
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