Failure Analysis and New Design of a Thin-Film Silicon-on-Insulator Power Metal-Oxide-Semiconductor Field-Effect Transistor Based on Emission Microscopy and 2-Dimensional Device Simulation

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1995-04-15

著者

• Sasaki Tatsuo

  Ntt Telecommunications Energy Laboratories

• SAKAI Tatsuo

  Departments of Neurosurgery, Tokyo Metropolitan Ohkubo Hospital

• Sakai T

  Ntt Telecommunications Energy Laboratories

• Matsumoto S

  Faculty Of Science And Technology Keio University

• Matsumoto Satoru

  Department Of Electronics And Electrical Engineering Keio University

• Sakai T

  Dainippon Screen Manufacturing Co. Ltd. Kyoto Jpn

• MATSUMOTO Satoshi

  NTT Intefrated Information & Energy Systems Laboratories

• YACHI Toshiaki

  NTT Integrated Information & Energy Systems Laboratories

• Fukumitsu Takao

  NTT Interdisciplinary Research Laboratories

• Kim Il-Jung

  NTT Interdisciplinary Research Laboratories

• Sasaki Tatsuo

  NTT Interdisciplinary Research Laboratories

• Kim I‐j

  Tohoku National Induatrial Res. Inst. Sendai Jpn

• Matsumoto S

  Ntt Telecommunications Energy Laboratories

• Yachi T

  Ntt Telecommunications Energy Laboratories

• Yachi Toshiaki

  Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

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