Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1966-11-15

著者

• KIKUTA Seishi

  Department of Applied Physics, Faculty of Engineering, University of Tokyo

• Kikuta Seishi

  Department Of Applied Physics Faculty Of Engineering University Of Tokyo

• Kikuta Seishi

  Department Of Applied Physics Faculty Of Engieering University Of Tokyo

• KOHRA Kazutake

  Department of Applied Physics, Faculty of Engineering, University of Tokyo

• SUGITA Yoshimitsu

  Central Research Laboratory, Hitachi Ltd.

• Kohra Kazutake

  Department Of Applied Physics Faculty Of Engineering The University Of Tokyo

• Sugita Yoshimitsu

  Central Research Laboratory Hitachi Ltd.

関連論文

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• An X-Ray Phase Plate Using Bragg-Case Diffraction
• Mossbauer Time Spectra of the Nuclear Forward Scattering from Coherently Vibrating Resonant Nuclei
• Switching of Photon Helicities in the Hard X-Ray Region with a Perfect Crystal Phase Retarder
• Time-Resolved X-Ray Diffraction from a Silicon Crystal Irradiated by a Q-Switched Nd:YAG Laser : Condensed Matter
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• Structure Analysis of the NiSi_2/(111)Si Interface by the X-Ray Standing Wave Method
• Temporal Mossbauer Absorber Thickness Effect Demonstrated Using Synchrotron Radiation
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