X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : I. General Considerations on collimators
スポンサーリンク
概要
- 論文の詳細を見る
General considerations are given on the intensity distributions obtained from various types of the collimator system made of a monolithic crystal, in which asymmetric Bragg-case diffractions take place successively by crystal components, so that an exploring beam of an extremely narrow angular spread of a few hundredths of the range of total reflection for the symmetric-case diffraction can be obtained. Type I and II of collimators use highly asymmetric diffractions; in type II the neighbouring components are inclined to each other to avoid deviation of the angular ranges of total reflection for two components. In type III the components are purposely arranged so that the angular ranges of total reflections for the neighbouring components overlap only partially. It is shown by calculations that an angular spread of about 0.1" is obtained by collimators of the above types using 422 diffraction of silicon with CuKα.
- 社団法人日本物理学会の論文
- 1970-11-05
著者
-
Kikuta Seishi
Department Of Applied Physics Faculty Of Engieering University Of Tokyo
-
Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
関連論文
- Study on the Si(111) √×√ - Ag Surface Structure by X-Ray Diffraction : Surfaces, Interfaces and Films
- Interference of Nuclear Bragg Scattered X-Rays in X-Ray Interferometer with Large Optical Path Difference
- Time Domain Interferometry in X-Ray Region Using Nuclear Resonant Scattering
- Time-Delayed Interferometry with Nuclear Resonant Scattering of Synchrotron Radiation
- Flux Growth and Characterization of α-^Fe_2O_3 Single Crystals for Nuclear Bragg Scattering Optical Components
- Focusing Properties of a Linear-Phase Bragg-Fresnel Lens
- A Plane Wave Diffraction on an Amplitude-Phase Laue Microinterferometer
- High-Resolution Measurements of Nuclear Bragg Scattering from a Synthetic α-^Fe_2O_3 Crystal
- An X-Ray Phase Plate Using Bragg-Case Diffraction
- Mossbauer Time Spectra of the Nuclear Forward Scattering from Coherently Vibrating Resonant Nuclei
- Switching of Photon Helicities in the Hard X-Ray Region with a Perfect Crystal Phase Retarder
- Time-Resolved X-Ray Diffraction from a Silicon Crystal Irradiated by a Q-Switched Nd:YAG Laser : Condensed Matter
- X-Ray Standing Wave Method Applied to the Characterization of InGaAsP Alloy Semiconductor Thin Film
- Observation of X-Ray Diffraction Spots from the (√×√)R30°Bi Structure on the Si(111) Surface under the Condition of Large Incidence Angle
- Structure Analysis of the NiSi_2/(111)Si Interface by the X-Ray Standing Wave Method
- Temporal Mossbauer Absorber Thickness Effect Demonstrated Using Synchrotron Radiation
- A New Method of X-Ray Diffraction Topography Using Monochromatic Divergent Beams Made by a Curved Crystal
- Nuclear Excitation of ^Fe Ions in Hydrochloric Acid Solution Using Synchrotron Radiation
- Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography
- Contact Microscopy with Synchrotorn Radiation X-rays Using a Transmission Grating
- Transmission-Type X-Ray Phase Retarder Using Ge Crystal in Laue Diffraction Geometry
- Structural Analysis of the NiSi_2/(111)Si Interface by the X-Ray Standing-Wave Method
- Nuclear Resonant Excitation of ^Dy and ^Eu by Synchrotron Radiation
- Characterization of Sb Atomic-Layer-Doped Si(100) Crystal by X-Ray Standing Wave Method
- High Frequency Time Modulation of Neutrons by LiNO_3 Crystals with Surface Acoustic Waves Excited under the Diffraction Condition
- Effect of the Soft X-Ray Standing Wave Fields on the Total Electron Yield Spectra from an InP Crystal
- A Multiple Crystal System for High Strain-Sensitivity X-Ray Topography and Its Applications
- A Generalized Phase Space Optical Analysis of X-Ray Optical Systems Using Crystal Monochromators : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
- Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : III. Type II Collimator
- X-Ray Studies of Dislocation Structures in a Sapphire Crystal
- Phase Shift of Neutrons in Magnetic Domains Observed by Interferometry
- Observation of Magnetic and Nuclear Phase Shifts of Neutrons by Interferometry
- High Frequency Time Modulation of the X-Ray Beam Diffracted from a LiNbO_3 Crystal by Surface Acoustic Waves
- Study on the Process of Polarization Reversal in NaNO_2 by Time-Resolved X-Ray Diffraction
- Separate Measurements of Dynamical and Kinematical X-Ray Diffractions from Perfect and Surface-Damaged Single Crystals with a Triple-Crystal Diffractometer
- X-Ray Topography under Conditions of Monochromatic Spherical Wave Diffraction
- Variations in X-Ray Fluorescence from GaAs and Photocurrent in CdS due to Standing Waves of X-Rays
- Angle-Resolved Plane Wave X-Ray Topography
- Intensity Anomaly of Thermal and Compton Scattering of X-Rays Accompanying the Bragg Reflection
- Temperature Effect on the Profile of X-Ray Diffraction of the Bragg Case from a Germanium Single Crystal
- Apparent Destruction of Interference by Use of a Partial Absorber in X-Ray Interferometry
- Studies on Dynamical Diffraction Phenomena of Neutrons Using Properties of Wave Fan
- Anomalous Enhancement of Transmitted Intensity in Asymmetric Diffraction of X-Rays from a Single Crystal
- Intensity Anomaly of X-Ray Compton and Thermal Scatterings Accompamying the Bragg Reflections from Perfect Si and Ge Crystals
- X-Ray Observation during Polarization Reversal of Ferroelectric NaNO_2
- An Observation of Neutron Pendellosung Fringes in a Wedge-Shaped Silicon Single Crytal
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : I. General Considerations on collimators
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : II. Type I Collimator
- Effect of Impurities on the Diffraction Curves of X-Rays from Dislocation-Free Silicon Crystals
- X-Ray Interference Fringes from a Wedge-Shaped Silicon Single Crystal Obtained by an Incident Plane Wave
- X-Ray Topographic Investigation on Phase Transition in Quartz. : I. Experimental Observations
- X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting
- High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method
- A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device
- Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-rays
- Propagation of X-Rays in a Slightly Distorted Silicon Crystal
- A New Technique of X-Ray Diffraction Microscopy of Scanning Type
- Study on the Crystallization Process of Polished Layers of Metals by Electron Diffraction and Microscopy
- Some Studies on X-Ray Wave Fields in Elastically Distorted Single Crystals. I. : Experimental Observations
- Theoretical Considerations on Bragg-case Diffraction of X-rays at a Small Glancing Angle
- Structural Investigation of Si(111) $\sqrt{3}\times \sqrt{3}$–In by Low-Energy Ion-Scattering Spectroscopy
- A Modification for X-Ray Diffraction Topography of Oscillating Method Using Monochromatic Divergent Beams