Propagation of X-Rays in a Slightly Distorted Silicon Crystal

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概要

著者

Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
Hashizume Hiroo
Department Of Applied Physics Faculty Of Engineering University Of Tokyo

関連論文

A New Method of X-Ray Diffraction Topography Using Monochromatic Divergent Beams Made by a Curved Crystal
Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography
A Multiple Crystal System for High Strain-Sensitivity X-Ray Topography and Its Applications
A Generalized Phase Space Optical Analysis of X-Ray Optical Systems Using Crystal Monochromators : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness
X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : III. Type II Collimator
X-Ray Studies of Dislocation Structures in a Sapphire Crystal
Study on the Process of Polarization Reversal in NaNO_2 by Time-Resolved X-Ray Diffraction
Separate Measurements of Dynamical and Kinematical X-Ray Diffractions from Perfect and Surface-Damaged Single Crystals with a Triple-Crystal Diffractometer
Intensity Anomaly of Thermal and Compton Scattering of X-Rays Accompanying the Bragg Reflection
Temperature Effect on the Profile of X-Ray Diffraction of the Bragg Case from a Germanium Single Crystal
Studies on Dynamical Diffraction Phenomena of Neutrons Using Properties of Wave Fan
Anomalous Enhancement of Transmitted Intensity in Asymmetric Diffraction of X-Rays from a Single Crystal
X-Ray Observation during Polarization Reversal of Ferroelectric NaNO_2
An Observation of Neutron Pendellosung Fringes in a Wedge-Shaped Silicon Single Crytal
X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : I. General Considerations on collimators
Effect of Impurities on the Diffraction Curves of X-Rays from Dislocation-Free Silicon Crystals
X-Ray Topographic Investigation on Phase Transition in Quartz. : I. Experimental Observations
X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting
High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method
A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device
Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-rays
The Crystallographic Orientation Dependence of Snoek-Type Internal Friction Peaks of an Fe-Si Alloy
Propagation of X-Rays in a Slightly Distorted Silicon Crystal
A New Technique of X-Ray Diffraction Microscopy of Scanning Type
Study on the Crystallization Process of Polished Layers of Metals by Electron Diffraction and Microscopy
Some Studies on X-Ray Wave Fields in Elastically Distorted Single Crystals. I. : Experimental Observations
Theoretical Considerations on Bragg-case Diffraction of X-rays at a Small Glancing Angle
Some Studies on X-Ray Wave Fields in Elastically Distorted Single Crystals. : II. Theoretical Analyses
A Modification for X-Ray Diffraction Topography of Oscillating Method Using Monochromatic Divergent Beams

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