Hashizume Hiroo | Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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概要
関連著者
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Hashizume Hiroo
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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HASHIZUME Hiroo
Department of Applied Physics, Faculty of Engineering, University of Tokyo
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KOHRA Kazutake
Department of Applied Physics, Faculty of Engineering, University of Tokyo
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Nakayama Kan
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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MATSUSHITA Tadashi
Department of Hematology and Oncology, Nagoya University Graduate School of Medicine
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Iida Atsuo
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo:(present Address)fujits
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Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Matsushita Tadashi
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Yoshimura Jun-ichi
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Iida Atsuo
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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ISHIDA Hidenobu
Department of Applied Chemistry & Bioengineering Graduate School of Engineering, Osaka City Universi
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Hashizume Hiroo
Department Of Applied Physics Faculty Of Engineering University Of Tokyo:research Institute Of Engin
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Kozaki Shigeru
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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SUGENO Takesi
Department of Applied Physics, Faculty of Engineering, University of Tokyo
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Sugeno Takesi
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Ishida Hidenobu
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
著作論文
- A Multiple Crystal System for High Strain-Sensitivity X-Ray Topography and Its Applications
- Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness
- X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting
- High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method
- A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device
- Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-rays
- The Crystallographic Orientation Dependence of Snoek-Type Internal Friction Peaks of an Fe-Si Alloy
- Propagation of X-Rays in a Slightly Distorted Silicon Crystal
- Some Studies on X-Ray Wave Fields in Elastically Distorted Single Crystals. I. : Experimental Observations
- Some Studies on X-Ray Wave Fields in Elastically Distorted Single Crystals. : II. Theoretical Analyses