A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1971-04-05
著者
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Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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ISHIDA Hidenobu
Department of Applied Chemistry & Bioengineering Graduate School of Engineering, Osaka City Universi
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Hashizume Hiroo
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Ishida Hidenobu
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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