Separate Measurements of Dynamical and Kinematical X-Ray Diffractions from Perfect and Surface-Damaged Single Crystals with a Triple-Crystal Diffractometer
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1978-05-05
著者
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Iida Atsuo
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo:(present Address)fujits
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KOHRA Kazutake
Department of Applied Physics, Faculty of Engineering, University of Tokyo
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Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
関連論文
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- Separate Measurements of Dynamical and Kinematical X-Ray Diffractions from Perfect and Surface-Damaged Single Crystals with a Triple-Crystal Diffractometer
- Intensity Anomaly of Thermal and Compton Scattering of X-Rays Accompanying the Bragg Reflection
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- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : I. General Considerations on collimators
- Effect of Impurities on the Diffraction Curves of X-Rays from Dislocation-Free Silicon Crystals
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- X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting
- High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method
- A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device
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- Theoretical Considerations on Bragg-case Diffraction of X-rays at a Small Glancing Angle
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