Theoretical Considerations on Bragg-case Diffraction of X-rays at a Small Glancing Angle
スポンサーリンク
概要
- 論文の詳細を見る
X-ray diffraction phenomenon, for which the glancing angle of the incident beam is so small that the effect of specular reflection can not be neglected, is studied theoretically. Two wave fields, one of which is usually neglected, are considered as the solution of the dispersion equation, and the boundary conditions of the waves are considered for the gradient of amplitude normal to the surface besides the amplitude. Numerical calculations are made for (220) reflection of CuK_<α1> from a germanium single crystal. The diffracted beam is stronger in intensity and broader in half-value width than that where specular reflection is not considered.
- 社団法人応用物理学会の論文
- 1971-05-05
著者
-
Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
-
Kishino Seigo
Central Research Laboratory
関連論文
- A New Method of X-Ray Diffraction Topography Using Monochromatic Divergent Beams Made by a Curved Crystal
- Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography
- A Multiple Crystal System for High Strain-Sensitivity X-Ray Topography and Its Applications
- A Generalized Phase Space Optical Analysis of X-Ray Optical Systems Using Crystal Monochromators : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
- Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : III. Type II Collimator
- X-Ray Studies of Dislocation Structures in a Sapphire Crystal
- Study on the Process of Polarization Reversal in NaNO_2 by Time-Resolved X-Ray Diffraction
- Separate Measurements of Dynamical and Kinematical X-Ray Diffractions from Perfect and Surface-Damaged Single Crystals with a Triple-Crystal Diffractometer
- Intensity Anomaly of Thermal and Compton Scattering of X-Rays Accompanying the Bragg Reflection
- Temperature Effect on the Profile of X-Ray Diffraction of the Bragg Case from a Germanium Single Crystal
- Studies on Dynamical Diffraction Phenomena of Neutrons Using Properties of Wave Fan
- Anomalous Enhancement of Transmitted Intensity in Asymmetric Diffraction of X-Rays from a Single Crystal
- Lattice Parameters of Ion-Implanted Silicon Crystals
- X-Ray Observation during Polarization Reversal of Ferroelectric NaNO_2
- An Observation of Neutron Pendellosung Fringes in a Wedge-Shaped Silicon Single Crytal
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : I. General Considerations on collimators
- Effect of Impurities on the Diffraction Curves of X-Rays from Dislocation-Free Silicon Crystals
- X-Ray Topographic Investigation on Phase Transition in Quartz. : I. Experimental Observations
- Anomalous Transmission in Bragg-Case Diffraction of X-Rays
- X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting
- High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method
- A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device
- Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-rays
- Propagation of X-Rays in a Slightly Distorted Silicon Crystal
- X-Ray Topographic Study of Lattice Defects Related with Degradation of GaAs-Ga_Al_xAs Double-Heterostructure Lasers : B-7: SEMICONDUCTOR LASERS (II)
- A New Technique of X-Ray Diffraction Microscopy of Scanning Type
- Study on the Crystallization Process of Polished Layers of Metals by Electron Diffraction and Microscopy
- Some Studies on X-Ray Wave Fields in Elastically Distorted Single Crystals. I. : Experimental Observations
- Enhanced Sensitivity of Anomalously Transmitted Intensity to Lattice Defects in Asymmetric Bragg-Case Diffraction of X-Rays
- Theoretical Considerations on Bragg-case Diffraction of X-rays at a Small Glancing Angle
- Characterization of Dislocations in β'-Gd_2(MoO_4)_3
- Determination of the Mole Fraction of GaP in GaAsP Single Crystal by A New X-Ray Diffraction Technique
- A Modification for X-Ray Diffraction Topography of Oscillating Method Using Monochromatic Divergent Beams