High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method
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概要
- 論文の詳細を見る
An X-ray imaging device utilizing a high sensitivity image orthicon tube has been incorporated in the divergent Laue method of diffraction topography using a point source. An X-ray optical magnification of diffraction images has made it possible to obtain a spatial resolution better than that of the imaging device. Preliminary experiments have demonstrated that individual dislocations in silicon crystals can be displayed with a resolution of better than 25μm.
- 社団法人応用物理学会の論文
- 1972-10-05
著者
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Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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Hashizume Hiroo
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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Kozaki Shigeru
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
関連論文
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