A Modification for X-Ray Diffraction Topography of Oscillating Method Using Monochromatic Divergent Beams
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概要
- 論文の詳細を見る
A new technique for the oscillation method using monochromatic divergent beams (the O.M.D. method) is proposed for obtaining an undistorted image of X-ray diffraction topograph. In taking topographs over a wide region of the specimen, the specimen and the photographic plate are oscillated around the same rotating axis in the usual O.M.D. method, while they are rotated around two parallel rotating axes in the present method. The rotation speeds of the specimen and the photographic plate are the same in both methods. An application of the new technique to a single crystal of NaCl is presented.
- 社団法人応用物理学会の論文
- 1974-09-05
著者
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Takano Yukio
Central Research Laboratory
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KOHRA Kazutake
Department of Applied Physics, Faculty of Engineering, University of Tokyo
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Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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