A New Technique of X-Ray Diffraction Microscopy of Scanning Type
スポンサーリンク
概要
- 論文の詳細を見る
A new technique of the scanning method is proposed for obtaining an undistorted image in the X-ray diffraction microscopy, where, in contrast to the usual Lang method, the specimen is movable in a appropriate direction while the photographic plate is at rest. This technique gives same image in size as the specimen for any diffracting plane employed. With use of X-rays of appropriate wavelengths, diffraction topographs of the same (hkl) plane in both the Bragg and Laue cases can be obtained. Experimental results and application of this technique are described.
- 社団法人応用物理学会の論文
- 1967-12-05
著者
-
Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
-
Kishino Seigo
Central Research Laboratory Hitachi Ltd.
-
Kishino Seigo
Central Research Laboratory
-
Sugita Yoshimitsu
Central Research Laboratory Hitachi Ltd.
関連論文
- A New Method of X-Ray Diffraction Topography Using Monochromatic Divergent Beams Made by a Curved Crystal
- Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography
- Vapor Growth of Germanium by the Hydrogen Reduction of Germanium Tetraiodide
- A Multiple Crystal System for High Strain-Sensitivity X-Ray Topography and Its Applications
- A Generalized Phase Space Optical Analysis of X-Ray Optical Systems Using Crystal Monochromators : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
- Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : III. Type II Collimator
- X-Ray Studies of Dislocation Structures in a Sapphire Crystal
- Study on the Process of Polarization Reversal in NaNO_2 by Time-Resolved X-Ray Diffraction
- Separate Measurements of Dynamical and Kinematical X-Ray Diffractions from Perfect and Surface-Damaged Single Crystals with a Triple-Crystal Diffractometer
- Intensity Anomaly of Thermal and Compton Scattering of X-Rays Accompanying the Bragg Reflection
- Temperature Effect on the Profile of X-Ray Diffraction of the Bragg Case from a Germanium Single Crystal
- Studies on Dynamical Diffraction Phenomena of Neutrons Using Properties of Wave Fan
- Anomalous Enhancement of Transmitted Intensity in Asymmetric Diffraction of X-Rays from a Single Crystal
- Lattice Parameters of Ion-Implanted Silicon Crystals
- X-Ray Observation during Polarization Reversal of Ferroelectric NaNO_2
- An Observation of Neutron Pendellosung Fringes in a Wedge-Shaped Silicon Single Crytal
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : I. General Considerations on collimators
- Effect of Impurities on the Diffraction Curves of X-Rays from Dislocation-Free Silicon Crystals
- Epitaxial Vapor Growth in Germanium-Bromine System
- X-Ray Topographic Investigation on Phase Transition in Quartz. : I. Experimental Observations
- Vapor Etching of Germanium by Germanium Tetraiodide
- Distribution and Character of Misfit Dislocations in Homoepitaxial Silicon Crystals
- Anomalous Transmission in Bragg-Case Diffraction of X-Rays
- Thermal Expansion Coefficient of a Pyrolitically Deposited Silicon Nitride Film
- X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting
- High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method
- A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device
- Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-rays
- Propagation of X-Rays in a Slightly Distorted Silicon Crystal
- X-Ray Topographic Study of Lattice Defects Related with Degradation of GaAs-Ga_Al_xAs Double-Heterostructure Lasers : B-7: SEMICONDUCTOR LASERS (II)
- A New Technique of X-Ray Diffraction Microscopy of Scanning Type
- Study on the Crystallization Process of Polished Layers of Metals by Electron Diffraction and Microscopy
- Some Studies on X-Ray Wave Fields in Elastically Distorted Single Crystals. I. : Experimental Observations
- Enhanced Sensitivity of Anomalously Transmitted Intensity to Lattice Defects in Asymmetric Bragg-Case Diffraction of X-Rays
- X-Ray Observations of Defect Structures in Silicon Crystals
- Theoretical Considerations on Bragg-case Diffraction of X-rays at a Small Glancing Angle
- Characterization of Dislocations in β'-Gd_2(MoO_4)_3
- Determination of the Mole Fraction of GaP in GaAsP Single Crystal by A New X-Ray Diffraction Technique
- A Modification for X-Ray Diffraction Topography of Oscillating Method Using Monochromatic Divergent Beams