Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-rays

スポンサーリンク

概要

著者

Kohra Kazutake
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
Nakayama Kan
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
Hashizume Hiroo
Department Of Applied Physics Faculty Of Engineering University Of Tokyo

関連論文

A New Method of X-Ray Diffraction Topography Using Monochromatic Divergent Beams Made by a Curved Crystal
Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography
A Multiple Crystal System for High Strain-Sensitivity X-Ray Topography and Its Applications
A Generalized Phase Space Optical Analysis of X-Ray Optical Systems Using Crystal Monochromators : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness
X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : III. Type II Collimator
X-Ray Studies of Dislocation Structures in a Sapphire Crystal
Study on the Process of Polarization Reversal in NaNO_2 by Time-Resolved X-Ray Diffraction
Separate Measurements of Dynamical and Kinematical X-Ray Diffractions from Perfect and Surface-Damaged Single Crystals with a Triple-Crystal Diffractometer
Intensity Anomaly of Thermal and Compton Scattering of X-Rays Accompanying the Bragg Reflection
Temperature Effect on the Profile of X-Ray Diffraction of the Bragg Case from a Germanium Single Crystal
Studies on Dynamical Diffraction Phenomena of Neutrons Using Properties of Wave Fan
Anomalous Enhancement of Transmitted Intensity in Asymmetric Diffraction of X-Rays from a Single Crystal
X-Ray Observation during Polarization Reversal of Ferroelectric NaNO_2
An Observation of Neutron Pendellosung Fringes in a Wedge-Shaped Silicon Single Crytal
X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : I. General Considerations on collimators
Effect of Impurities on the Diffraction Curves of X-Rays from Dislocation-Free Silicon Crystals
X-Ray Topographic Investigation on Phase Transition in Quartz. : I. Experimental Observations
X-Ray Diffraction Topography Utilizing Double-Crystal Arrangement of (+, +) or Non-Parallel (+, -) Setting
High-Resolution Video Display of X-Ray Topographs with the Divergent Laue Method
A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device
Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-rays
The Crystallographic Orientation Dependence of Snoek-Type Internal Friction Peaks of an Fe-Si Alloy
Propagation of X-Rays in a Slightly Distorted Silicon Crystal
A New Technique of X-Ray Diffraction Microscopy of Scanning Type
Study on the Crystallization Process of Polished Layers of Metals by Electron Diffraction and Microscopy
Some Studies on X-Ray Wave Fields in Elastically Distorted Single Crystals. I. : Experimental Observations
Theoretical Considerations on Bragg-case Diffraction of X-rays at a Small Glancing Angle
Some Studies on X-Ray Wave Fields in Elastically Distorted Single Crystals. : II. Theoretical Analyses
A Modification for X-Ray Diffraction Topography of Oscillating Method Using Monochromatic Divergent Beams

もっと見る

スポンサーリンク