Total-Reflection X-Ray Fluorescence Analysis Using Monochromatic Beam
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1984-11-20
著者
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Iida Atsuo
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo:(present Address)fujits
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Iida Atsuo
Department Of Industrial Chemistry Faculty Of Engineering University Of Tokyo
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Gohshi Yohichi
Department Of Industrial Chemistry Faculty Of Engineering University Of Tokyo
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Gohshi Yohichi
Department Of Applied Chemistry School Of Engineering The University Of Tokyo
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Gohshi Yohichi
Department Of Applied Chemistry Faculty Of Engineering The University Of Tokyo
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- Preface
- Surface Sensitive X-ray Absorption Fine Structure Measurement Using Sample Current Induced by Totally Reflected X-rays.