A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1987-08-20

著者

• Iida Atsuo

  Photon Factory, Institute of Materials Structure Science

• Iida A

  Photon Factory Institute Of Materials Structure Science

• HAYAKAWA Satio

  Dept. of Astrophys., Nagoya University, Nagoya.

• AOKI Sadao

  Institute of Applied Physics, University of Tsukuba

• Iida A

  High Energy Accelerator Res. Organization Tsukuba Jpn

• Iida Atsuo

  Photon Factory Institute Of Materials Structure Science

• Iida Atsuo

  Photon Factory National Laboratory For High Energy Physics (kek)

• Aoki Sadao

  Institute Of Applied Physics University Of Tsukuba

• HAYAKAWA Shinjiro

  Department of Applied Chemistry, Graduate School of Engineering, Hiroshima University

• Hayakawa S

  Department Of Engineering Fundamentals Hiroshima University

• Hayakawa Shinjiro

  Department Of Applied Chemistry University Of Tokyo

• Hayakawa Shinjiro

  Department Of Applied Chemistry Graduate School Of Engineering Hiroshima University

• Sakurai Kenji

  Department of Urology, Kitasato University, School of Medicine.

• GOHSHI Yohichi

  Department of Applied Chemistry, University of Tokyo

• YAMAJI Hironao

  Institute of Applied Physics, University of Tsukuba

• Sakurai K

  Sophia Univ. Tokyo Jpn

• Sakurai Kenji

  Cardiopulmonary Division Department Of Medicine Keio University School Of Medicine

• Sakurai K

  Graduate School Of Science Osaka University

• Sakurai K

  National Research Inst. Metals Ibaraki

• Yamaji Hironao

  Institute Of Applied Physics University Of Tsukuba

• Sakurai K

  Department Of Basic Sciences The University Of Tokyo

• Gohshi Yohichi

  Department Of Applied Chemistry School Of Engineering The University Of Tokyo

• Gohshi Yohichi

  Department Of Applied Chemistry Faculty Of Engineering The University Of Tokyo

• Sakurai Kenji

  Department Of Biology Graduate School Of Science University Of Tokyo

• Sakurai Kenji

  Department Of Biological Production Faculty Of Bioresource Sciences Akita Prefectural University

関連論文

• 30. Dynamic Response of Local Layer and Molecular Orientation in Smectic Liquid Crystals by Time Resolved X-ray Micro-Diffraction(poster presentation,Soft Matter as Structured Materials)
• Image Formation of Periodic Objects Illuminated by Undulator Radiation in a Zone Plate Microscope
• Analysis of the intralayer molecular orientation in the B1 phase of a bent-core liquid crystal molecule using X-ray microbeam(New Frontiers in Colloidal Physics : A Bridge between Micro- and Macroscopic Concepts in Soft Matter)
• Zero Gravity Experiment of Superfluid Helium
• Sub-100-nm-Resolution Zone Plate Soft X-Ray Microscope Using Undulator Radiation
• Characterization of Calcium Carbonate Polymorphs with Ca K Edge X-ray Absorption Fine Structure Spectroscopy
• X-ray Absorption Near Edge Structure (XANES) of CuInSe_2, Brass and Phosphor Bronze by Photoacoustic Method : Photoacoustic Spectroscopy
• X-Ray Photoacoustic Spectroscopy of Brass
• Photoacoustic Response to X-Ray Absorption in Copper and Brass
• Investigation of Individual Micrometer-Size Kosa Particle with On-Site Combination of Electron Microscope and Synchrotron X-Ray Microscope
• Characteristics of Platinum-Palladium Alloy Film for X-Ray Mirrors
• SHUNTLESS (VEIN-TO-VEIN) HEMODIALYSIS IN ACUTE AND CHRONIC RENAL FAILURE
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• Data Processing for Obtaining Atomic Images from SrTiO_3 X-Ray Fluorescence Hologram
• Atomic-Resolution X-Ray Fluorescence Holography of Zn(0.02wt%)in a GaAs Wafer
• X-Ray Fluorescence Holography of SrTiO_3 Compared with X-Ray Photoelectron Holography
• Epitaxial Growth of InAs on Single-Crystalline Mn-Zn Ferrite Substrates
• Contribution of Ni KLL Auger Electrons to the Probing Depth of the Conversion Electron Yield Measurements
• Analysis of Contamination Layer of InP During LPE Process by Synchrotron Radiation-Excited X-Ray Fluorescence : Surfaces, Interfaces and Films
• Chemical State Mapping by X-Ray Fluorescence Using Absorption Edge Shifts : Techniques, Instrumentations and Measurement
• Characterization of Co-O Thin Films by X-Ray Fluorescence Using Chemical Shifts of Absorption Edges
• A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation
• Production of Reflection Point Sources for Hard X-Ray Gabor Holography
• Hard X-Ray Microtomography Using X-Ray Imaging Optics
• X-Ray Imaging with Toroidal Mirror : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
• Determination of the Stokes-Poincare Parameters for a Synchrotron X-Ray Beam by Multiple Bragg Scattering
• Contact Microscopy with Synchrotorn Radiation X-rays Using a Transmission Grating
• Photoacoustic EXAFS of Solid Phase
• Spin State Analysis of Epitaxial Mn Compound Films Using High Resolution X-Ray Fluorescence
• Dynamic Behaviour of the local Layer Structure of Antiferroelectric Liquid Crystals under a High Electric Field Measured by Time-resolved Synchrotron X-Ray Microbeam Diffraction
• X-Ray Analysis of the Layer Structure in the Chiral Smectic Phase Showing V-shaped Switching
• Structure of Needlelike Defect in Homogeneously Aligned Cells of a Ferroelectric Liquid Crystal Mixture Studied Using X-Ray Microbeam
• Spontaneous Layer Twist in a Stripe Texture of Chiral Ferroelectric Smectics Observed by Synchrotron X-Ray Microdiffraction
• Study on Molecular Dimerization Inducing the Antiferroelectric Liquid Crystalline Phase by Measuring the Smectic Layer Thickness in Various Compounds
• Influence of the Optical Purity on the Smectic Layer Thickness and the Transition Order in Enantiomeric Mixtures of an Antiferroelectric Liquid Crystal
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• Determination of the Mass Resolution and the Depth Resolution of Time of Flight Elastic Recoil Detection Analysis Using Heavy Ion Beams
• lmproverment in the Detection Limits of Elastic Recoil Detection Analysis (ERDA)Using a Time-of-Flight Detection
• X-Ray Photoelectron Spectroscopy Using A Focused 300 μm-Diameter X-Ray Beam
• Correlation between X-Ray Reflectivity and Rutherford Backscattering Spectroscopy for Density Measurement of Thin Films
• Thermal Stability of Ni-C Multilayer Mirror for X-Rays
• Surface Roughness Evaluation of Multilayer Coated X-ray Mirrors by Scanning Tunneling Microscope
• Grazing Incidence X-Ray Diffraction Study of Arachidic Acid Monolayer on Cyanine Dye Aqueous Solution
• X-Ray Photoelectron Spectroscopy of Micrometer-Size Surface Area Using Synchrotron Radiation
• Determination of the GaAs/AlAs Superlattice Period from the First-Order Superlattice Bragg Reflection
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• X-Ray Hologram Obtained by Using Synchrotron Radiation
• A Soft X-Ray Microprobe Using an Axisymmetric Tandem Toroidal Mirror
• Local Layer Structures in Ferroelectric Liquid Crystal Cells Filled with a Material Which Exhibits Cholesteric-Chiral Smectic C Phase Transition
• Characterization of the Local Layer Structure of a Narrow Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction
• Characterization of the Local Layer Structure at a Broad Wall in a Surface Stabilized Ferroelectric Liquid Crystal during Electric Field Application Using Synchrotron X-Ray Microdiffraction
• Characterization of the Local Layer Structure of a Broad Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction
• Correction of the Self-Absorption Effect in Fluorescence X-Ray Absorption Fine Structure
• DLTS Study on the Gradation of the Trap Concentration Profiles in n-CdTe Crystals
• DLTS Study of Pulsed Ruby Laser Irradiation Effects on n-CdTe
• Inelastic Mean Free Path of Photoelectrons in Ag Determined by Total Reflection X-Ray Photoelectron Spectroscopy
• Shadow-Projection X-Ray Microtomography for Line-Like Objects
• Spectroscopic Study of a Sliding Spark with an Electron Beam
• Contact Resistance and V-I Characteristics in a Ag-Doped Bi-Sr-Ca-Cu-O Superconductor
• Preparation of a Ag-Doped Bi-Sr-Ca-Cu-O Bulk Sample by the Floating-Zone Method
• Interpretation of the X-Ray Burst with Precursor in Terms of Expanding Envelope
• X-Ray Absorption and Photoelectron Spectroscopies Using Total Reflection X-Rays
• High-Sensitivity Image-Sensor-Incorporated Image Intensifier Tube with Charge-Coupled Device for X-Ray Diffraction
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• A Circuit for a Well-Controlled Sliding Spark
• A Balloon-Borne Infrared Telescope Cooled by Liquid Nitrogen
• A Novel Hair Analysis for Trace Elements on Hair Cross Section by Synchrotron Radiation X-Ray Fluorescence Imaging with X-Ray Microprobe:Two-Dimensional Distribution of Lead and Zinc on Smelter Hair
• X-Ray Fluorescence Analysis of Hg in SiO_2 Films Deposited by Hg-Sensitized Photo-CVD
• A Soft X-Ray Microscope Using an Imaging Detector
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• Spectro-Diffractometry for Chemical-State Analysis Based on In-Advance Simulations
• In-Advance Simulation and Chemical State Analysis by Spectro-Diffractometry
• Fabrication and Characterization of Multilayer Zone Plate for Hard X-Rays : Techniques, Instrumentations and Measurement
• Possibility of the Discrimination of Different Chemical States by Energy-Dispersive X-Ray Spectroscopy
• Fourier Analysis of Interference Structure in X-Ray Specular Reflection from Thin Films
• Electron Spectroscopy Using a Gas-Flow Proportional Counter under Gaseous Environment and its Application to X-Ray absorption fine structure Measurements
• Changes in the Distributions of Chemical Elements in Regenerating Scales of Carp, Cyprinus carpio, Studied by SRXRF Imaging
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• Soft X-Ray Dark-Field Imaging Microscope with Wolter-Type Grazing-Incidence Mirrors
• A Microchannel Plate X-Ray Collimator
• Trace element concentrations in iron type cosmic spherules determined by the SR-XRF method
• Focusing of the Synchrotron Radiation in the Soft X-Ray Region
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• Comparison of Anthracene Purity Obtained by Various Processes
• Site-Selective Chemical State Analysis for Magnetite Structure Using Powder Spectro-Diffractometry (Proceedings of the Second International Conference on SRMS(Synchrotron Radiation in Materials Science)(2))
• Nondestructive Imaging of Internal Structures of Frog (Xenopus laevis) Embryos by Shadow-Projection X-Ray Microtomography
• DLTS Study of Heat Treatments on n-CdTe Crystals
• Spontaneous Layer Twist in a Stripe Texture of Chiral Ferroelectric Smectics Observed by Synchrotron X-Ray Microdiffraction
• X-Ray Analysis of the Layer Structure in the Chiral Smectic Phase Showing V-shaped Switching
• Characterization of the Local Layer Structure of a Narrow Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction
• Time-Lapse Observation of Electrolysis of Copper Sulfate with a Full-Field X-ray Fluorescence Imaging Microscope
• Production of Reflection Point Sources for Hard X-Ray Gabor Holography
• Local Layer Structures in Ferroelectric Liquid Crystal Cells Filled with a Material Which Exhibits Cholesteric-Chiral Smectic C Phase Transition
• Dynamic Behaviour of the Local Layer Structure of Antiferroelectric Liquid Crystals under a High Electric Field Measured by Time-resolved Synchrotron X-Ray Microbeam Diffraction
• Hard X-Ray Microtomography Using X-Ray Imaging Optics
• Surface Sensitive X-ray Absorption Fine Structure Measurement Using Sample Current Induced by Totally Reflected X-rays.
• Fabrication of an Axisymmetric Wolter Type I Mirror with a Gold Deposited Reflecting Surface
• X-ray Absorption Near Edge Structure Study on Valence Changes of Ni and Co in Li1−xNi0.82Co0.15M0.03O2 (M=Nb, Ti) Cathode Materials

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