X-Ray Analysis of the Layer Structure in the Chiral Smectic Phase Showing V-shaped Switching
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概要
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The layer structure of the chiral smectic phase showing V-shaped switching was investigated using the X-ray diffraction method. In thin planar cells of a three-component mixture in which V-shaped switching was first reported, the chevron layer structure was confirmed. The layer structure almost kept chevron even in the application of an electric field, and additional small diffraction peaks suggesting the existence of a substructure during V-shaped switching were observed. Preliminary time-resolved results are also reported.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-02-15
著者
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Takanishi Yoichi
Department Of Organic And Polymeric Materials Tokyo Institute Of Technology
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Iida Atsuo
Photon Factory Institute Of Materials Structure Science
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Takezoe Hideo
Department Of Organic And Polymeric Materials Tokyo Institute Of Technology
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TAKAHASHI Yumiko
The Graduate University for Advanced Studies
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Ishikawa Ken
Department Of Organic And Polymeric Materials Tokyo Institute Of Technology
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Ogasawara Toyokazu
Department Of Organic And Polymeric Materials Tokyo Institute Of Technology
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Iida Atsuo
Photon Factory, Institute of Materials Structure Science, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan
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ISHIKAWA Ken
Department of Applied Physics, University of Tokyo
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Takahashi Yumiko
The Graduate University for Advanced Studies, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan
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