Correction of the Self-Absorption Effect in Fluorescence X-Ray Absorption Fine Structure

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30. Dynamic Response of Local Layer and Molecular Orientation in Smectic Liquid Crystals by Time Resolved X-ray Micro-Diffraction(poster presentation,Soft Matter as Structured Materials)
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Characterization of the Local Layer Structure of a Narrow Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction
Characterization of the Local Layer Structure at a Broad Wall in a Surface Stabilized Ferroelectric Liquid Crystal during Electric Field Application Using Synchrotron X-Ray Microdiffraction
Characterization of the Local Layer Structure of a Broad Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction
Correction of the Self-Absorption Effect in Fluorescence X-Ray Absorption Fine Structure
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Spontaneous Layer Twist in a Stripe Texture of Chiral Ferroelectric Smectics Observed by Synchrotron X-Ray Microdiffraction
X-Ray Analysis of the Layer Structure in the Chiral Smectic Phase Showing V-shaped Switching
Characterization of the Local Layer Structure of a Narrow Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction
Local Layer Structures in Ferroelectric Liquid Crystal Cells Filled with a Material Which Exhibits Cholesteric-Chiral Smectic C Phase Transition
Dynamic Behaviour of the Local Layer Structure of Antiferroelectric Liquid Crystals under a High Electric Field Measured by Time-resolved Synchrotron X-Ray Microbeam Diffraction

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