Spontaneous Layer Twist in a Stripe Texture of Chiral Ferroelectric Smectics Observed by Synchrotron X-Ray Microdiffraction
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概要
- 論文の詳細を見る
We noticed stripe domains accompanied with a zigzag defect loop, which cannot be explained as simple zigzag walls. The structure was analyzed using a synchrotron X-ray microbeam with a space resolution of 5×5 µ m2. We propose that the structure is a chevron structure with a spontaneous layer twist, which is predicted to exist by the continuum theory but has not yet been observed experimentally.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 1996-02-15
著者
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Takanishi Yoichi
Department Of Organic And Polymeric Materials Tokyo Institute Of Technology
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Iida Atsuo
Photon Factory Institute Of Materials Structure Science
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Takezoe Hideo
Department Of Organic And Polymeric Materials Tokyo Institute Of Technology
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Fukuda Atsuo
Department Of Electronic And Electrical Engineering Trinity College University Of Dublin
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Ishikawa Ken
Department Of Organic And Polymeric Materials Tokyo Institute Of Technology
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Fukuda Atsuo
Department of organic and Polymeric Materials, Tokyo Institute of Technology,
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Iida Atsuo
Photon Factory, National Laboratory for High Energy Physics, 1-1 Oho, Tsukuba-shi, Ibaraki 305, Japan
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Takezoe Hideo
Department of organic and Polymeric Materials, Tokyo Institute of Technology,
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ISHIKAWA Ken
Department of Applied Physics, University of Tokyo
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Takanishi Yoichi
Department of Organic and Polymeric Materials, Tokyo Institute of Technology,
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