Characterization of the Local Layer Structure of a Narrow Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction

概要

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Synchrotron X-ray microbeam small angle diffraction experiments were carried out for the characterization of the local layer structure of the narrow wall of a zig-zag defect in a surface stabilized ferroelectric liquid crystal cell. A series of the rocking curve ($\omega$) and the azimuthal ($\chi$) intensity distribution profiles were measured as a function of the vertical position across the narrow wall. The local layer was deflected at the wall in the $\chi$ direction. For the inclined narrow wall making an angle of a few degrees to 10° with respect to the rubbing direction, the deflected layer bent in both $\omega$ and $\chi$ directions. At the narrow wall running parallel to the rubbing direction, the layer bent only in the $\omega$ direction. The local layer structure was discussed in relation to the surface anchoring effect and a uniformly bent layer structure was proposed to explain experimental results.
Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
2001-03-15