Noma Takashi | Canon Research Center Canon Inc.
スポンサーリンク
概要
関連著者
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Noma Takashi
Canon Research Center Canon Inc.
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Iida Atsuo
Photon Factory Institute Of Materials Structure Science
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Iida Atsuo
Photon Factory, Institute of Materials Structure Science
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Iida Atsuo
Photon Factory National Laboratory For High Energy Physics (kek)
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Noma T
Canon Research Center Canon Inc.
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MIYATA Hirokatsu
Canon Research Center, Canon Inc.
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Iida A
Photon Factory Institute Of Materials Structure Science
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Iida A
High Energy Accelerator Res. Organization Tsukuba Jpn
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TAKADA Kazuhiro
Canon Research Center, Canon Inc.
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TOGANO Takeshi
Canon Research Center, Canon Inc.
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MUKAIDE Taihei
Canon Research Center, Canon Inc.
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Takada Kazuhiro
Canon Research Center
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Mukaide Taihei
Canon Research Center Canon Inc.
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Togano Takeshi
Canon Research Center Canon Inc.
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Iida Atsuo
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, Oho, Tsukuba, Ibaraki 305-0801, Japan
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Iida Atsuo
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, O-ho, Tsukuba, Ibaraki 305-0801, Japan
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Takada Kazuhiro
Canon Research Center, Canon Inc., Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
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Togano Takeshi
Canon Research Center, Canon Inc., Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
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Noma Takashi
Canon Research Center, Canon Inc., Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
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Miyata Hirokatsu
Canon Research Center, Canon Inc., Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
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Mukaide Taihei
Canon Research Center, Canon Inc., Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
著作論文
- Local Layer Structures in Ferroelectric Liquid Crystal Cells Filled with a Material Which Exhibits Cholesteric-Chiral Smectic C Phase Transition
- Characterization of the Local Layer Structure of a Narrow Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction
- Characterization of the Local Layer Structure at a Broad Wall in a Surface Stabilized Ferroelectric Liquid Crystal during Electric Field Application Using Synchrotron X-Ray Microdiffraction
- Characterization of the Local Layer Structure of a Broad Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction
- Correction of the Self-Absorption Effect in Fluorescence X-Ray Absorption Fine Structure
- Characterization of the Local Layer Structure of a Narrow Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction
- Local Layer Structures in Ferroelectric Liquid Crystal Cells Filled with a Material Which Exhibits Cholesteric-Chiral Smectic C Phase Transition