Surface Roughness Evaluation of Multilayer Coated X-ray Mirrors by Scanning Tunneling Microscope
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1989-05-20
著者
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KITA Eiji
Institute of Applied Physics, University of Tsukuba
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FUJIWARA Shuzo
National Institute of Materials and Chemical Research
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AOKI Sadao
Institute of Applied Physics, University of Tsukuba
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Aoki S
Univ. Tsukuba Ibaraki
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Aoki Sadao
Institute Of Applied Physics University Of Tsukuba
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Aoki S
Institute Of Applied Physics University Of Tsukuba
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NAKAJIMA Kunio
Seiko Instruments Inc.
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Aoki S
Kyushu Inst. Technology Fukuoka
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Tasaki A
Univ. Tsukuba Tsukuba
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Tasaki Akira
Institute Of Applied Physics University Of Tsukuba:(present Address) Technical Laboratory Taiyo Yude
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Tasaki Akira
Institute Of Applied Physics University Of Tsukuba
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Fujiwara S
National Institute Of Materials And Chemical Research
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FUJIWARA Shiro
Institute of Applied Physics, University of Tsukuba
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KOYANO Tamotsu
Institute of Applied Physics, University of Tsukuba
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Fujiwara Shiro
Institute For Optical Research Tokyo University Of Education
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Koyano Tamotsu
Institute Of Applied Physics University Of Tsukuba
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Saji A
Chubu Electric Power Co. Nagoya
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Kita Eiji
Institute For Applied Physics Tsukuba University
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Aoki Sadao
Department Of Pure And Applied Science College Of General Education University Of Tokyo:(present Add
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