MATSUSHITA Tadashi | Department of Hematology and Oncology, Nagoya University Graduate School of Medicine

スポンサーリンク

概要

関連著者

もっと見る

著作論文

A New binding Assay of von Willebrand Factor and Glycoprotein Ib Using Solid-Phase Biotinylated Platelets
Definite diagnosis in Japanese patients with protein C deficiency by identification of causative PROC mutations
Mutational analysis of SOS1 gene in acute myeloid leukemia
Identification of amino acid residues responsible for von Willebrand factor binding to sulfatide by charged-to-alanine-scanning mutagenesis
Recurrent Mutations of Factor XI Gene in Japanese
Recurrent Intramural Hematoma of the Small Intestine in a Severe Hemophilia A Patient with a High Titer of Factor VIII Inhibitor : A Case Report and Review of the Literature
High Titer of ADAMTS13 Inhibitor Associated with Thrombotic Microangiopathy of the Gut and Skeletal Muscle after Allogeneic Hematopoietic Stem Cell Transplantation
Irrespective of CD34 expression, lineage-committed cell fraction reconstitutes and re-establishes transformed Philadelphia chromosome-positive leukemia in NOD/SCID/IL-2Rγc^ mice
Classic Polyarteritis Nodosa Presenting Rare Clinical Manifestations in a Patient with Hemophilia A
Identification of the regulatory elements of the human von Willebrand factor for binding to platelet GPIb. Importance of structural integrity of the regions flanked by the CYS1272-CYS1458 disulfide bond
Observations on Equal-Inclination Interference Fringes from a Thin Crystal of Silicon Using Nearly Parallel X-Ray Beam
A Generalized Phase Space Optical Analysis of X-Ray Optical Systems Using Crystal Monochromators : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
A High-Efficiency Polarizing Interferometer for Far-Infrared Spectroscopy
Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness
TTP/HUS and vWF-CP
A Dispersive Method of Measuring Extended X-Ray Absorption Fine Structure
Curvature Denendence of Reflection Profiles of Silicon Curved Crystal Monochromators as Measured with Double-Crystal (n,-n) Setting : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : III. Type II Collimator

もっと見る

スポンサーリンク