Intensity Anomaly of X-Ray Compton and Thermal Scatterings Accompamying the Bragg Reflections from Perfect Si and Ge Crystals

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概要

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• The intensity variations in the Compton and thermal scatterings with the change in diffraction condition were measured using a double crystal spectrometer of parallel setting for Si and Ge single crystals with CuKαa nd Mo Kα radiations. For comparison, the flurescent emission was also measured for Ge with Mo Kα. A large dip was observed in the intensity cures of the Compton and thermal scatterings for all the cases, like in the fluorescent scattering observed by Batterman. The asymmetric profile of the intensity curve varies with the specimen, radiation and reflecting plane used. The various asymmetric profiles are explained qualitatively by the difference in mechanism of the scattering, i.e. by taking into consideration that the Compton scattering is caused mainly by the outer electrons, the thermal scattering by the whole electrons and the fluorescent emmission by the inner electrons.

• 社団法人日本物理学会の論文
• 1966-08-05

著者

• Kikuta Seishi

  Department Of Applied Physics Faculty Of Engieering University Of Tokyo

• Annaka Shoichi

  Tokyo University Of Education

• Annaka Shoichi

  Tokyo University Of Mercatile Marine

• Kohra Kazutaka

  Department Of Applied Physics Faculty Of Engineering University Of Tokyo

• ANNAKA S.

  Tokyo University of Mercantile Marine

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