Variations in X-Ray Fluorescence from GaAs and Photocurrent in CdS due to Standing Waves of X-Rays
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概要
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The intensities of the K-series fluorescence from GaAs and the photocurrent in CdS were measured during the dynamical diffraction of X-rays. Variations in the fluorescence during the 111 and 111 reflections and the photocurrent during the 110 reflection are explained by considering X-ray standing-wave fields in crystals. The effect of the standing waves on the fluorescence yield is emphasized when the fluorescence from layers near the surface is measured. The curve of the variation of the photocurrent in CdS is explained by considering the proper absorption coefficient of electrons in the crystal. A principle for the standing waves in the dynamical diffraction of X-rays is also given.
- 社団法人応用物理学会の論文
- 1984-12-20
著者
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Takahashi Toshio
Department of Applied Physics, Faculty of Engineering, University of Tokyo
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Kikuta Seishi
Department Of Applied Physics Faculty Of Engieering University Of Tokyo
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Annaka S
Tokyo Univ. Mercantile Marine Tokyo
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Annaka Shoichi
Physics Department Tokyo University Of Education
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Takahashi Toshio
Department Of Applied Physics Faculty Of Engineering University Of Tokyo
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