X-Ray Interference Fringes from a Wedge-Shaped Silicon Single Crystal Obtained by an Incident Plane Wave

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概要

著者

Kikuta Seishi
Department Of Applied Physics Faculty Of Engieering University Of Tokyo
Kohra Kazutaka
Department Of Applied Physics Faculty Of Engineering University Of Tokyo

関連論文

Study on the Si(111) √×√ - Ag Surface Structure by X-Ray Diffraction : Surfaces, Interfaces and Films
Interference of Nuclear Bragg Scattered X-Rays in X-Ray Interferometer with Large Optical Path Difference
Time Domain Interferometry in X-Ray Region Using Nuclear Resonant Scattering
Time-Delayed Interferometry with Nuclear Resonant Scattering of Synchrotron Radiation
Flux Growth and Characterization of α-^Fe_2O_3 Single Crystals for Nuclear Bragg Scattering Optical Components
Focusing Properties of a Linear-Phase Bragg-Fresnel Lens
A Plane Wave Diffraction on an Amplitude-Phase Laue Microinterferometer
High-Resolution Measurements of Nuclear Bragg Scattering from a Synthetic α-^Fe_2O_3 Crystal
An X-Ray Phase Plate Using Bragg-Case Diffraction
Mossbauer Time Spectra of the Nuclear Forward Scattering from Coherently Vibrating Resonant Nuclei
Switching of Photon Helicities in the Hard X-Ray Region with a Perfect Crystal Phase Retarder
Time-Resolved X-Ray Diffraction from a Silicon Crystal Irradiated by a Q-Switched Nd:YAG Laser : Condensed Matter
X-Ray Standing Wave Method Applied to the Characterization of InGaAsP Alloy Semiconductor Thin Film
Observation of X-Ray Diffraction Spots from the (√×√)R30°Bi Structure on the Si(111) Surface under the Condition of Large Incidence Angle
Structure Analysis of the NiSi_2/(111)Si Interface by the X-Ray Standing Wave Method
Temporal Mossbauer Absorber Thickness Effect Demonstrated Using Synchrotron Radiation
Nuclear Excitation of ^Fe Ions in Hydrochloric Acid Solution Using Synchrotron Radiation
Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography
Contact Microscopy with Synchrotorn Radiation X-rays Using a Transmission Grating
Transmission-Type X-Ray Phase Retarder Using Ge Crystal in Laue Diffraction Geometry
Structural Analysis of the NiSi_2/(111)Si Interface by the X-Ray Standing-Wave Method
Nuclear Resonant Excitation of ^Dy and ^Eu by Synchrotron Radiation
Characterization of Sb Atomic-Layer-Doped Si(100) Crystal by X-Ray Standing Wave Method
High Frequency Time Modulation of Neutrons by LiNO_3 Crystals with Surface Acoustic Waves Excited under the Diffraction Condition
Effect of the Soft X-Ray Standing Wave Fields on the Total Electron Yield Spectra from an InP Crystal
Observations on Equal-Inclination Interference Fringes from a Thin Crystal of Silicon Using Nearly Parallel X-Ray Beam
X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : III. Type II Collimator
X-Ray Studies of Dislocation Structures in a Sapphire Crystal
Phase Shift of Neutrons in Magnetic Domains Observed by Interferometry
Observation of Magnetic and Nuclear Phase Shifts of Neutrons by Interferometry
High Frequency Time Modulation of the X-Ray Beam Diffracted from a LiNbO_3 Crystal by Surface Acoustic Waves
X-Ray Topography under Conditions of Monochromatic Spherical Wave Diffraction
Variations in X-Ray Fluorescence from GaAs and Photocurrent in CdS due to Standing Waves of X-Rays
Angle-Resolved Plane Wave X-Ray Topography
Intensity Anomaly of Thermal and Compton Scattering of X-Rays Accompanying the Bragg Reflection
Temperature Effect on the Profile of X-Ray Diffraction of the Bragg Case from a Germanium Single Crystal
Apparent Destruction of Interference by Use of a Partial Absorber in X-Ray Interferometry
Contac Microradiography with Monochromatic Divergent X-Rays
Intensity Anomaly of X-Ray Compton and Thermal Scatterings Accompamying the Bragg Reflections from Perfect Si and Ge Crystals
An Observation of Neutron Pendellosung Fringes in a Wedge-Shaped Silicon Single Crytal
X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : I. General Considerations on collimators
X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. : II. Type I Collimator
Effect of Impurities on the Diffraction Curves of X-Rays from Dislocation-Free Silicon Crystals
X-Ray Interference Fringes from a Wedge-Shaped Silicon Single Crystal Obtained by an Incident Plane Wave
Variation with Thickness in the Profile of Laue-Case Diffraction Curve of X-Rays from a Thin Si Crystal
Structural Investigation of Si(111) $\sqrt{3}\times \sqrt{3}$–In by Low-Energy Ion-Scattering Spectroscopy

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