Variation with Thickness in the Profile of Laue-Case Diffraction Curve of X-Rays from a Thin Si Crystal

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概要

• 論文の詳細を見る
• 社団法人日本物理学会の論文
• 1968-09-15

著者

• Kohra Kazutaka

  Department Of Applied Physics Faculty Of Engineering University Of Tokyo

• Kikuta Seiji

  Department Of Applied Physics Faculty Of Engineering University Of Tokyo

関連論文

• Observations on Equal-Inclination Interference Fringes from a Thin Crystal of Silicon Using Nearly Parallel X-Ray Beam
• Contac Microradiography with Monochromatic Divergent X-Rays
• Intensity Anomaly of X-Ray Compton and Thermal Scatterings Accompamying the Bragg Reflections from Perfect Si and Ge Crystals
• X-Ray Interference Fringes from a Wedge-Shaped Silicon Single Crystal Obtained by an Incident Plane Wave
• Variation with Thickness in the Profile of Laue-Case Diffraction Curve of X-Rays from a Thin Si Crystal

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