High Pressure Magnetization Measurements on URu_2Si_2 : Condensed Matter: Electronic Properties, etc.

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We have made high pressure magnetization measurements on a single crystalline URu_2Si_2 up to P = 1.61GPa, in magnetic fields up to 15T and in the temperature range between 4.2 and 100 K. A characteristic temperature T_0 which corresponds to an antiferromagnetic phase transition shows a slight increase with pressure, while T_<max>, at which the temperature dependence of the magnetization exhibits a maximum, remains nearly constant with pressure. We have also observed that the pressure dependence of the high field magnetization at low temperatures shows a shallow minimum at around 1 GPa, in contrast to a strong and monotonic increase in a staggered magnetic moment revealed by recent elastic neutron diffraction experiments under pressures. To reconcile this discrepancy, we suggest, in conjunction with other experimental results, that the observed large staggered moment in the neutron diffraction experiments is not static but fluctuating in time.
社団法人日本物理学会の論文
2000-08-15