Highly Reliable Bottom-Contact Pentacene TFTs with a Poly(p-chloroxylylene) Layer Selectively Grown on a Gate-Insulator
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概要
- 論文の詳細を見る
- 2007-09-19
著者
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Aoyagi Yoshinobu
Riken
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TSUKAGOSHI Kazuhito
International Center for Materials and Nanoarchitectonics, National Institute for Materials Science
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TSUKAGOSHI Kazuhito
RIKEN
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NOMOTO Kazumasa
Sony Corporation Research Center
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KASAHARA Jiro
Sony Corporation Research Center
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Minari Takeo
Riken Saitama Jpn
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Minari Takeo
Riken
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Minari Takeo
International Center For Materials And Nanoarchitectonics National Institute For Materials Science
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Kasahara Jiro
Sony Corporation Materials Laboratory
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YASUDA Ryoichi
Sony Corporation, Materials Laboratory
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HIRAI Nobukazu
Sony Corporation, Materials Laboratory
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YAGI Iwao
Sony Corporation, Materials Laboratory
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Yagi Iwao
Sony Corporation Materials Laboratory
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Hirai Nobukazu
Sony Corporation Materials Laboratory
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Yasuda Ryoichi
Sony Corporation Materials Laboratory
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Nomoto Kazumasa
Sony Corporation Materials Laboratory
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Tsukagoshi Kazuhito
National Inst. Materials Sci. (nims) Ibaraki Jpn
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Tsukagoshi Kazuhito
International Center For Materials Nanoarchitectonics National Institute For Materials Science
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Tsukagoshi Kazuhito
International Center For Materials Nanoarchitectonics (mana) National Institute For Materials Scienc
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Tsukagoshi Kazuhito
International Center For Materials And Nanoarchitectonics National Institute For Materials Science
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Tsukagoshi Kazuhito
Nanotechnology Research Institute National Institute Of Advanced Industrial Science And Technology (
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Tsukagoshi Kazuhito
Nanoscience Development And Support Team Riken
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Tsukagoshi Kazuhito
Hitachi Cambridge Laboratory Hitachi Europe Ltd. Cavendish Laboratory
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