X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability(Dependable Computing)
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概要
- 論文の詳細を見る
In this paper, a complete X-tolerant test data compression solution is proposed for system-on-a-chip (SOC) testing. The solution achieves low-cost testing by employing not only selective Huffman vertical coding (SHVC) for test stimulus compression but also MISR-based time compactor for test response compaction. Moreover, the solution is nonintrusive; since it can tolerate any number of unknown states (also called X state) in test responses such that it does not require modifying the logic of core to eliminate or block the sources of unknown states. Furthermore, the solution achieves enhanced diagnosis capability over conventional MISR. The enhanced diagnosis requires the least hardware overhead by reusing the existing masking logic and achieves significant saving in diagnostic time. Experimental results for ISCAS 89 benchmarks as well as the evaluation of hardware implementation have proven the efficiency of the proposed test solution.
- 社団法人電子情報通信学会の論文
- 2005-07-01
著者
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Zeng Gang
Graduate School Of Information Science Nagoya University
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Ito Hideo
Chiba Univ. Chiba‐shi Jpn
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ITO Hideo
Faculty of Engineering, Chiba University
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Ito Hideo
Faculty Of Engineering Chiba University
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Zeng Gang
Graduate School of Engineering, Nagoya University
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