NISHIJIMA Masaaki | Semiconductor Device Research Center, Semiconductor Company, Matsushita Electric Industrial Co., Ltd
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概要
- 同名の論文著者
- Semiconductor Device Research Center, Semiconductor Company, Matsushita Electric Industrial Co., Ltdの論文著者
関連著者
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NISHIJIMA Masaaki
Semiconductor Device Research Center, Semiconductor Company, Matsushita Electric Industrial Co., Ltd
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Tanaka Tsuyoshi
Semiconductor Device Research Center Matsushita Electronics Corporation
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Nishitsuji M
Matsushita Electronics Corp. Nagaokakyo‐shi Jpn
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Nisijima Masaaki
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Tanaka Tsuyoshi
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Yanagihara Manabu
Semiconductor Device Research Center, Semiconductor Company, Matsushita Electric Industrial Co., Ltd
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Terahara Takafumi
The Authors Are With Optoelectronic Systems Laboratory Network System Laboratories Fujitsu Laborator
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Tanaka T
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Ueda Tetsuzo
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Yanagihara M
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Yanagihara Manabu
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd
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Murata Tomohiro
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Sakai Hiroyuki
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Kuroda Masayuki
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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LI Ming
Panasonic Boston Laboratory, Panasonic Technologies Company
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Li Ming
Panasonic Boston Laboratory Panasonic Technologies Company
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Tsurumi Naohiro
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd
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Nagai Shuichi
Panasonic Boston Laboratory, Panasonic Technologies Company
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Ishida Hidetoshi
Semiconductor Device Research Center, Semiconductor Company, Matsushita Electric Industrial Co., Ltd
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Ueda Tetsuzo
Semiconductor Device Research Center, Semiconductor Company, Matsushita Electric Industrial Co., Ltd
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KURODA Masayuki
Semiconductor Device Research Center, Semiconductor Company, Matsushita Electric Industrial Co., Ltd
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Nagai Shuichi
Panasonic Boston Laboratory Panasonic Technologies Company
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ANDA Yoshiharu
Semiconductor Device Research Center, Matsushita Electronics Corporation
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Ishida Hidetoshi
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd
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Yamamoto Shu
Kdd R&d Laboratories Inc.
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NISHITSUJI Mitsuru
Semiconductor Research Center, Matsushita Electric Industrial Co, Ltd.
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Ueda Daisuke
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd
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Ueda D
Matsushita Electronics Corp. Takatsuki‐shi Jpn
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ISHII Motonori
Semiconductor Device Research Center, Semiconductor Company, Matsushita Electric Industrial Co., Ltd
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Ueda Daisuke
Semiconductor Device Research Center Matsushita Electronics Corporation
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Ueda Daisuke
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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MURAYAMA Keiichi
Discrete Division, Semiconductor Company, Matsushita Electric Industrial Co., Ltd.
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Yamamoto S
Kddi R&d Laboratories Inc.
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KUNIHISA Taketo
Semiconductor Device Research Center, Matsushita Electronics Corporation
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YAMAMOTO Shinji
Discrete Device Division, Matsushita Electronics Corporation
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YOKOYAMA Takahiro
Semiconductor Device Research Center, Matsushita Electronics Corporation
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NISHII Katsunori
Semiconductor Device Research Center, Matsushita Electronics Corporation
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ISHIKAWA Osamu
Semiconductor Device Research Center, Matsushita Electronics Corporation
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Ishii Motonori
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Kunihisa T
Matsushita Electric Industrial Co. Ltd. Takatsuki‐shi Jpn
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Kunihisa Taketo
Semiconductor Device Research Center Matsushita Electric Industrial Co. Ltd.
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Murayama Keiichi
Discrete Division Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Nishitsuji Mitsuru
Semiconductor Device Research Center Matsushita Electronics Corporation
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Yokoyama T
Semiconductor Device Research Center Matsushita Electronics Corporation
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Nishii K
Semiconductor Device Research Center Matsushita Electronics Corporation
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Ishikawa Osamu
Semiconductor Device Research Center Matsushita Electronics Corporation
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Ishida Masahiro
Semiconductor Device Research Center Matsushita Electronics Corporation
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Nakazawa Satoshi
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Ishida Hidetoshi
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Ueda Tetsuzo
Semiconductor Devices Development Center, Industrial Devices Company, Panasonic Corporation, Nagaokakyo, Kyoto 617-8520, Japan
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Nishijima Masaaki
Semiconductor Devices Development Center, Industrial Devices Company, Panasonic Corporation, Nagaokakyo, Kyoto 617-8520, Japan
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Tsurumi Naohiro
Semiconductor Devices Development Center, Industrial Devices Company, Panasonic Corporation, Nagaokakyo, Kyoto 617-8520, Japan
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UEDA Tetsuzo
Semiconductor Device Research Center, Semiconductor Company, Panasonic Corporation
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MURATA Tomohiro
Semiconductor Device Research Center, Semiconductor Company, Panasonic Corporation
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NEGORO Noboru
Semiconductor Device Research Center, Semiconductor Company, Panasonic Corporation
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NISHIJIMA Masaaki
Semiconductor Device Research Center, Semiconductor Company, Panasonic Corporation
著作論文
- Improved RF Characteristics of InGaP/GaAs HBTs by Using Novel Ledge Coupled Capacitor (LCC) Structure(Heterostructure Microelectronics with TWHM2003)
- AlGaN/GaN-based Millimeter Wave Monolithic ICs with Laser-Drilled Via-holes Through Sapphire(Session9B: GaN and SiC Device Process Technology)
- AlGaN/GaN-based Millimeter Wave Monolithic ICs with Laser-Drilled Via-holes Through Sapphire(Session9B: GaN and SiC Device Process Technology)
- Temperature Compensation Technique of InGaP/GaAs Power HBT with Novel Bias Circuit Using Schottky Diodes(Joint Special Issue on Heterostructure Microelectronics with TWHM 2000)
- Low Power Dissipation Single-Supply MMIC Power Amplifier for 5.8 GHz Electronic Toll Collection System (Special Issue on High-Frequency/speed Devices in the 21st Century)
- 200 W Output Power at S-Band in AlGaN/GaN Heterojunction Field Effect Transistors with Field Plates on Si Substrates
- K-Band AlGaN/GaN MIS-HFET on Si with High Output Power over 10 W