Sugita Yutaka | Hitachi Research Laboratory Hitachi Lid.

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著作論文

X-Ray Reflectometry and Infrared Analysis of Native Oxides on Si (100) Formed by Chemical Treatment
Transient Oxide Layer at a Thermally Grown SiO_2/Si Interface, Interpreted Based on Local Vibration and X-Ray Reflectivity
X-Ray Reflectometry and Infrared Analysis of Native Oxides on Si(100) Formed in Chemical Treatment
Exchange Couplings in Ni-Fe/Mn-Ir/Fe-Mn Multilayers
Exchange Coupling in (Mn-Ir, Fe-Mn)/Co/Ni-Fe Multilayers
Giant Magnetoresistance and Low Saturation Fields in Ni-Fe-Co/Cu Multilayers with NiO Buffer Layers
Magnetoresistance in Fe-Mn/Ni-Fe-Co/Co/Cu/Co/Ni-Fe-Co Sandwiches with NiO or NiO/Hf Buffer Layer
Exchange Coupling between Antiferromagnetic Mn-Ir and Ferromagnetic Ni-Fe Layers
Magnetoresistance Effects of Fe-Mn/Ni-Fe-Co/(Au, Ag, Al)/Ni-Fe-Co Sandwiches
Magnetoresistance Effects in Ni-Fe-Co/Cu/Co-Pt Trilayers
Magnetoresistance Effects in Spin-Valve Multilayers Including Three Ni-Fe-Co Layers
Magnetoresistance and Interlayer Exchange Coupling between Magnetic Layers in Fe-Mn/Ni-Fe-Co/Cu/Ni-Fe-Co Multilayers
Magnetoresistance and Preferred Orientation in Fe-Mn/Ni-Fe/Cu/Ni-Fe Sandwiches with Various Buffer Layer Materials
Effects of Fe Buffer Layer Thickness on Magnetoresistance in Ni-Fe/Cu Multilayers
Oscillation of Preferred Orientation with Thickness of Cu Layer in Ni-Fe/Cu Multilayers
Grown-in Microdefects in a Slowly Grown Czochralski Silicon Crystal Observed by Synchrotron Radiation Topography
Mierodefects in an As-Grown Czoehralski Silicon Crystal Studied by Synchrotron Radiation Section Topography with Aid of Computer Simulation
Observation of Microdefects in As-Grown Czochralski Silicon Crystals by Synchrotron Radiation Topography
Numerically Simulated and Experimentally Obtained X-Ray Section Topographs of a Spherical Strain Field in a Floating Zone Silicon Crystal
Synchrotron Radiation Section Topography with Extremely High-Order Reflection and Its Application to the Characterization of MCZ-Silicon Crystals
Measurement and Analysis of the Static Debye-Waller Factor of Cz-Silicon with Small Oxygen Precipitates : Techniques, Instrumentations and Measurement
Measurement of the Static Debye-Waller Factor of Silicon Crystals by the Pendellosung Fringe Method
Quantum-Size Effect from Photoluminescence of Low-Temperature-Oxidized Porous Si
High-Accuracy X-ray Reflectivity Study of Native Oxide Formed in Chemical Treatment
Current-Voltage Characteristics of YBa_2Cu_3O_y/La_Ca_MnO_z/YBa_2Cu_3O_y Trilayered-Type Junctions
Fabrication of Y-Ba-Cu-O Superconductor/La-Ca-Mn-O Oxide Magnetic Material Layered Films
Lattice Parameters and Surface Morphology of the High-T_c Phase in Bi-Sr-Ca-Cu-O Superconducting Thin Films
Structures and Superconducting Properties of Y-Ba-Cu-O Sputtered Films
Synchrotron-Radiation-Induced Modification of Silicon Dioxide Film at Room Temperature : Beam Induced Physics and Chemistry
Synchrotron-Radiation-Induced Modification of Silicon Dioxide Film at Room Temperature
Synchrotron Radiation-Assisted Removal of Oxygen and Carbon Contaminants from a Silicon Surface
Structures and Magnetic Properties of Fe/Co Multilayer Films : Magnetism, Magnetic Materials and Devices
Evaluation of Photoemitted Current from SiO_2 Film on Silicon During Synchrotron Radiation Irradiation
Synchrotron Radiation-Assisted Silicon Film Growth by Irradiation Parallel to the Substrate

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