Measurement of the Static Debye-Waller Factor of Silicon Crystals by the Pendellosung Fringe Method

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1987-11-20

著者

• Sugiyama Hiroshi

  Department of Chemistry, Graduate School of Science Kyoto University

• IIDA Satoshi

  Department of Physics,Kwansei-Gakuin University

• Iida S

  Nagaoka Univ. Technol. Nagaoka Jpn

• Kawata Hiroshi

  Photon Factory Institute Of Materials Structure Science

• Sugiyama H

  Institute Of Materials Structure Science High Energy Accelerator Research Organization Kek

• Kawata Hiroshi

  National Laboratory for High Energy Physics (KEK)

• Sugita Yutaka

  Research Institute Of Electrical Communication Tohoku University

• Sugita Yutaka

  Hitachi Research Laboratory Hitachi Lid.

• Iida S

  Toyama Univ. Toyama Jpn

• Iida Shinya

  Speedfam Co. Ltd.

• Iida Satoshi

  Department Of Orthopaedic Surgery Matsudo City Hospital

• Sugita Y

  Department Of Physics Toyama University

• Kawata H

  Department Of Physics And Electronics Gra4uate School Of Engineering Osaka Prefecture University

• SUGITA Yoshimitsu

  Department of Physics, Toyama University

• KAWATA Haruo

  Fujitsu Laboratories Limited

• Iida Satoshi

  Department Of Orthopaedic Surgery Chiba University

• Sugiyama Hiroshi

  Department Of Chemistry Graduate School Of Science Kyoto University

• Sugita Yoshimitsu

  Department Of Physics Toyama University

• Kawata Hiroshi

  National Laboratory For High Energy Physics

• Sugiyama Hiroshi

  Department Of Chemistry Faculty Of Science

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