NAKAJIMA Anri | Fujitsu Laboratories Ltd.
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概要
関連著者
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NAKAJIMA Anri
Fujitsu Laboratories Ltd.
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YOKOYAMA Naoki
Fujitsu Laboratories Ltd.
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FUTATSUGI Toshiro
Fujitsu Laboratories Ltd.
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SUGITA Yoshihiro
Fujitsu Laboratories Ltd.
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KAWAMURA Kazuo
Fujitsu Laboratories Ltd.
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Nara Yasuo
Department Of Pharmacy School Of Pharmacy Shujitsu University
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Nara Yasuo
就実大学 薬学部応用薬学
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Nara Yasuo
武庫川女子大学
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USUKI Tatsuya
Fujitsu Laboratories Ltd.
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青山 肇
技術研究組合超先端電子技術開発機構(aset)超微細sr露光技術研究室(pxl研究室)
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TOMITA Hirofumi
Fujitsu Laboratories Ltd.
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HORIGUCHI Naoto
Fujitsu Laboratories Ltd.
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Usuki Tatsuya
Fujitsu Lab. Ltd. Atsugi Jpn
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青山 肇
株式会社半導体先端テクノロジーズ
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Yamori Y
Institute For World Health Development Mukogawa Women's University
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Itakura T
Fujitsu Lab. Ltd. Atsugi Jpn
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Aoyama Hajime
Fujitsu Laboratories Ltd.
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Nara Y
Univ. East Asia Shimonoseki Jpn
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Nara Yasuo
Fujitsu Laboratories Ltd.
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Yokoyama Naoki
Department of Pediatrics, Kobe University Graduate School of Medicine
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Sugita Yutaka
Research Institute Of Electrical Communication Tohoku University
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Sugita Yutaka
Hitachi Research Laboratory Hitachi Lid.
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Nakayama Noriaki
Fujitsu Laboratories Ltd.
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Nakayama Noriaki
Semiconductor Technology Academic Research Center (starc)
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Nakayama Noriaki
Department Of Advanced Materials Science And Engineering Faculty Of Engineering
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Nakayama Noriaki
Fujitsu Laboratories Lid.
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Itakura Toru
Fujitsu Laboratories Ltd.
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Sugita Y
Department Of Physics Toyama University
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Nakajima A
Kaneka Corporation
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Itakura Toru
Fujitsu Laboratories Ltd
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Yokoyama N
Fujitsu Laboratories Ltd.
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Futatsugi T
Fujitsu Laboratories Ltd.
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Horiguchi N
Fujitsu Laboratories Ltd.
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Kawamura K
Kochi Univ. Kochi Jpn
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Yokoyama Naoki
Institute For Nano Quantum Information Electronics The University Of Tokyo
著作論文
- Formation of Sb Nanocrystals in SiO_2 Film Using Ion Implantation Followed by Thermal Annealing
- Isolated Nanometer-Size Si Dot Arrays Fabricated Using Electron-Beam Lithography, Reactive Ion Etching, and Wet Etching in NH_4OH/H_2O_2/H_2O
- Quantum-Size Effect from Photoluminescence of Low-Temperature-Oxidized Porous Si
- Theoretical Analysis of Write Errors and Number of Stored Electrons for Ten-Nanoscale Si Floating-Dot Memory
- Si Quantum Dot Formation with Low-Pressure Chemical Vapor Deposition