Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever
スポンサーリンク
概要
- 論文の詳細を見る
The photovoltage on a polycrystalline silicon solar cell has been investigated by Kelvin probe force microscopy (KFM) under light illumination. In our KFM system, a piezoresistive cantilever and a new feedback method for potential determination were adopted to realize an accurate measurement of potential under both dark condition and light illumination. As a result, we observed a photovoltage drop around the grain boundary and a slight difference in photovoltage between two different grains on the polycrystalline silicon solar cell.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-08-30
著者
-
Ujihara Toru
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
-
Takihara Masaki
Institute Of Industrial Science University Of Tokyo
-
Igarashi Takatoshi
Institute Of Industrial Science University Of Tokyo
-
Takahashi Takuji
Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan
-
Igarashi Takatoshi
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
-
Ujihara Toru
Department of Crystalline Materials Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
関連論文
- Super-High Brightness and High-Spin-Polarization Photocathode
- Epitaxial Growth of NdFeAsO Thin Films by Molecular Beam Epitaxy
- Investigation of Spatial Resolution in Current-Induced Magnetic Field Detection by Magnetic Force Microscopy
- Real Time Magnetic Imaging by Spin-Polarized Low Energy Electron Microscopy with Highly Spin-Polarized and High Brightness Electron Gun
- Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates
- 2P293 Formation of domains in fluorescent lipids doped DMPC-DOPC binary bilayers supported on SiO_2/Si substrates under local light irradiation.(40. Membrane structure,Poster Session,Abstract,Meeting Program of EABS & BSJ 2006)
- Photoabsorption Characterization on Surface InAs Nanostructures Using Light-Illuminated Scanning Tunneling Microscopy
- Light-Illuminated STM Studies on InAs Nano-Structures
- Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy
- Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials
- Local Characterization of Photovoltage on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever
- Formation of Ultra-low Density (${\leq}10^{4}$ cm-2) Self-Organized InAs Quantum Dots on GaAs by a Modified Molecular Beam Epitaxy Method
- Current-Induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe
- Dual Light Illumination Method in Scanning Tunneling Microscopy for Photoinduced Current Measurements on InAs Wires
- Molecular Beam Epitaxy Growth of Superconducting NdFeAs(O,F) Thin Films Using a F-Getter and a Novel F-Doping Method
- Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy
- Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential
- Sample-and-Hold Operation in Kelvin Probe Force Microscopy
- Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy
- Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy
- Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy
- Direct Growth of AlN Single Crystal on Sapphire by Solution Growth Method
- Magnetic Field Observation around Current Path by Magnetic Force Microscopy
- Direct Growth of AlN Single Crystal on Sapphire by Solution Growth Method
- Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever
- Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezoresistive Cantilever
- High-Efficiency Conversion of Threading Screw Dislocations in 4H-SiC by Solution Growth
- Dual-Bias Modulation Method for Scanning Tunneling Spectroscopy