Dual-Bias Modulation Method for Scanning Tunneling Spectroscopy

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概要

• 論文の詳細を見る

• We proposed a novel method for scanning tunneling spectroscopy, in which a difference in differential conductance ($\mathrm{d}I/\mathrm{d}V$) between two d.c. biases was extracted using a double lock-in technique. We investigated some experimental parameters to be optimized, and finally obtained the spectra of $\mathrm{d}I/\mathrm{d}V$ differences on self-assembled InAs quantum dot structures. As a result, we observed different conductance gaps attributable to a difference between the band gaps of the quantum dot and the surrounding wetting layer, and observed some peaks in the spectra on the dot as well. In addition, reasonable current-voltage curves were numerically reproduced from the measured $\mathrm{d}I/\mathrm{d}V$ spectra.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2004-07-15

著者

• Muranaka Masayuki

  Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

• Takahashi Takuji

  Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan

関連論文

• Investigation of Spatial Resolution in Current-Induced Magnetic Field Detection by Magnetic Force Microscopy
• Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates
• Photoabsorption Characterization on Surface InAs Nanostructures Using Light-Illuminated Scanning Tunneling Microscopy
• Light-Illuminated STM Studies on InAs Nano-Structures
• Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy
• Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials
• Local Characterization of Photovoltage on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever
• Formation of Ultra-low Density (${\leq}10^{4}$ cm-2) Self-Organized InAs Quantum Dots on GaAs by a Modified Molecular Beam Epitaxy Method
• Current-Induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe
• Dual Light Illumination Method in Scanning Tunneling Microscopy for Photoinduced Current Measurements on InAs Wires
• Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy
• Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential
• Sample-and-Hold Operation in Kelvin Probe Force Microscopy
• Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy
• Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy
• Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy
• Magnetic Field Observation around Current Path by Magnetic Force Microscopy
• Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever
• Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezoresistive Cantilever
• Dual-Bias Modulation Method for Scanning Tunneling Spectroscopy

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