Investigation of Spatial Resolution in Current-Induced Magnetic Field Detection by Magnetic Force Microscopy

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概要

• 論文の詳細を見る
• 2005-12-30

著者

• Edura Tomohiko

  Waseda Univ. Nanotechnology Research Laboratory

• Wada Yasuo

  Waseda Univ. Graduate School Of Science And Engineering

• Tsutsui Ken

  Waseda Univ. Nanotechnology Research Laboratory

• TAKAHASHI Takuji

  Institute of Industrial Science, University of Tokyo

• Edura Tomihiko

  Nanotechnology Research Laboratory Waseda University

• Saida Daisuke

  Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

• Takahashi Takuji

  Institute Of Industrial Science University Of Tokyo

• Wada Yasuo

  Nanotechnology Research Laboratory Waseda University

• Tsutsui Ken

  Nanotechnology Research Laboratory Waseda University

• Saida Daisuke

  Institute Of Industrial Science University Of Tokyo

• Takahashi Takuji

  Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan

関連論文

• Single Grain and Single Grain Boundary Resistance of Pentacene Thin Film Characterized by Nano-scale Electrode Array
• Investigation of Spatial Resolution in Current-Induced Magnetic Field Detection by Magnetic Force Microscopy
• Fabrication of Planar Nano-gap Electrodes for Single Molecule Evaluation
• Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy
• Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates
• Development of a Sub-micron Processing Method with Ion Implantation
• Photoabsorption Characterization on Surface InAs Nanostructures Using Light-Illuminated Scanning Tunneling Microscopy
• Light-Illuminated STM Studies on InAs Nano-Structures
• Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy
• Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials
• Local Characterization of Photovoltage on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever
• Formation of Ultra-low Density (${\leq}10^{4}$ cm-2) Self-Organized InAs Quantum Dots on GaAs by a Modified Molecular Beam Epitaxy Method
• Current-Induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe
• Dual Light Illumination Method in Scanning Tunneling Microscopy for Photoinduced Current Measurements on InAs Wires
• Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy
• Fabrication of Planar Nano-gap Electrodes for Single Molecule Evaluation
• Photothermal Signal and Surface Potential around Grain Boundaries in Multicrystalline Silicon Solar Cells Investigated by Scanning Probe Microscopy
• Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential
• Sample-and-Hold Operation in Kelvin Probe Force Microscopy
• Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy
• Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy
• Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy
• Single Grain and Single Grain Boundary Resistance of Pentacene Thin Film Characterized Using a Nanoscale Electrode Array
• Magnetic Field Observation around Current Path by Magnetic Force Microscopy
• Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever
• Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezoresistive Cantilever
• Dual-Bias Modulation Method for Scanning Tunneling Spectroscopy

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