Current-Induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe
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概要
- 論文の詳細を見る
A current measuring method through magnetic field detection by magnetic force microscopy (MFM) was proposed and demonstrated. We observed the magnetic field around a GaAs/AlGaAs mesa stripe induced by an AC current under 10 μA. First, we pointed out the significance of elimination of the electrostatic force working between the MFM tip and the sample to obtain the magnetic force signals clearly. Then we found that the amplitudes of magnetic force signals increased with increase of the current, and that the magnetic force signals also depended on the MFM tip magnetization directions.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-07-15
著者
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Takahashi Takuji
Institute Of Industrial Science University Of Tokyo
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Saida Daisuke
Institute Of Industrial Science University Of Tokyo
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Takahashi Takuji
Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan
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