Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy
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概要
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We have proposed a dual sampling method in intermittent-contact-mode atomic force microscopy with a piezoresistive cantilever for photothermal (PT) measurements. This method realizes a sensitive detection of thermal expansion in a sample by excluding crosstalk from photoabsorption signals generated at the piezoresistive sensor on the cantilever. We have confirmed the feasibility of this method through the excitation photon energy dependence of the PT signal measured on Si and GaAs.
- 2009-08-25
著者
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Hara Kenji
Institute For Virus Research Kyoto University
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Takahashi Takuji
Institute of Industrial Science and Institute for Nano Quantum Information Electronics, The University of Tokyo, Meguro, Tokyo 153-8505, Japan
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Takahashi Takuji
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
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Hara Kenji
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
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